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EMC Testing Solution Provider


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This probe set is used to measure conducted emissions from IC pins (measured with 1 ohm/150 ohm direct coupling).

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This probe set is used for direct RF measurements of current and voltage on a single IC pin.

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The P503 probe set is used for conducted immunity measurements according to IEC 62132-4.

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The P501 probe set is used for conducted immunity measurements according to IEC 62132-4.

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The P500 probe set is used for conducted immunity measurements according to IEC 62132-4.

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The P331-2 probe set is used for conductively coupling ESD pulses into integrated circuits, and the BPS 203 pulse power station controls the probes.

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The P331 L-ESD probe set is used to conductively couple ESD pulses (200ps rise time) into integrated circuits, and the BPS 203 pulse power station controls the probes.

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 The P250 probe is used for direct contact measurements of impulse immunity of IC pins according to IEC 62215-3 and IEC 61000-4-4.

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This set of probes is used to determine the pulse immunity of integrated circuits under high current and high voltage.

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The MP Scope measurement kit is a movable shielded cabin (shielded canopy) on the developer's workbench, which is used to place some sensitive measurement equipment during EFT or high-frequency detection , such as oscilloscopes, spectrum analyzers and oth

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