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P202 and P302 L-EFT set EFT pulse injection probe set

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P202 and P302 L-EFT set EFT pulse injection probe set
  • Product Description
  • Main features
  • Technical parameters
    • Commodity name: P202 and P302 L-EFT set EFT pulse injection probe set
    • Commodity ID: 1064797992776257536
    • 品牌11: LANGER
    • 描述: This set of probes is used to determine the pulse immunity of integrated circuits under high current and high voltage.
    • 品牌: LANGER

           This set of probes is used to determine the pulse immunity of integrated circuits under high current and high voltage. Compared with P211 and P311, this set of probes will produce stronger current and higher voltage. When testing EFT or electrostatic discharge equipment, there is an attenuated interference pulse at the pins of the integrated circuits used in the equipment. The probes of the P200/P300 series can simulate these attenuated interference pulses, so as to analyze the anti-interference of each pin during the operation of the integrated circuit. The parameters of P200 series probes for current coupling need to be determined according to the principle of magnetic field pulse coupling in the electronic component group. The parameters of P300 series probes for voltage coupling need to be determined according to the principle of electric field pulse coupling in the electronic component group.

    The P202/P302 L-EFT set includes the following accessories:

    Recommended options

     

  • main feature:

    1. P202 EFT Current Generator (~40V) SMA

    P202 L-EFT current generator is used to couple the pulse current in the wire of the tested integrated circuit. Similar to the IEC 61000-4-2 and IEC61000-4-4 standards, it reproduces the attenuated interference current pulse at the IC input. During detection, these interference current pulses are generated by the magnetic field.

    2. P302 EFT Voltage Generator ( ~ 50 0V) SMA

    P302 L-EFT pulse voltage generator is used to couple the interference pulse conduction into the integrated circuit under test. When testing according to the IEC 61000-4-2 and ICE 61000-4-4 standards, the P302 simulates the interference pulses that have reached the integrated circuit. These interference voltage pulses generated during the test may be generated by electric field coupling.

  • 1. P20 2  L-EFT current generator

    Internal resistance

    ≈ 1 Ω

    The capacity of the coupling capacitor

    1.2 µF

    shape

    1.5 / 5 ns

    frequency

    0.1 Hz ～10kHz

    Voltage

    ± (0.4 ～40) V

    inductance

    ≈ 2 nH

    Dimensions (LxWxH)

    (78 x 35 x 31) mm

    2. P302 L-EFT pulse voltage generator

    Internal resistance

    ≈ 1 50  Ω

    The capacity of the coupling capacitor

    20 pF

    shape

    1.5 / 20 ns

    frequency

    0.1 Hz ～10kHz

    Voltage

    ± ( 5～50 0)V

    inductance

    50 nH

    Dimensions (LxWxH)

    (78 x 35 x 31) mm

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