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The field source included in the Langer ESD 200 ps Field Coupled Probe Set produces a fast electric and magnetic ESD pulse field ( 200 ps).

LANGER

The field sources included in the EFT field-coupled probe set generate electric and magnetic EFT burst fields.

LANGER

The P1202-2 field source produces an electrostatic discharge magnetic field.

LANGER

This probe set is used to measure conducted emissions from IC pins (measured with 1 ohm/150 ohm direct coupling).

LANGER

This probe set is used to measure conducted emissions from IC pins (measured with 1 ohm/150 ohm direct coupling).

LANGER

This probe set is used for direct RF measurements of current and voltage on a single IC pin.

LANGER

The P503 probe set is used for conducted immunity measurements according to IEC 62132-4.

LANGER

The P501 probe set is used for conducted immunity measurements according to IEC 62132-4.

LANGER

The P500 probe set is used for conducted immunity measurements according to IEC 62132-4.

LANGER

The P331-2 probe set is used for conductively coupling ESD pulses into integrated circuits, and the BPS 203 pulse power station controls the probes.

LANGER

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