Wisdom
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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
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Automotive Electronic EMC Test System
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- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
-
Automotive Electronic EMC Test System
-
- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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-
- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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Product
EMC Testing Solution Provider
Picture
Name
Description
Brand
This set of probes is used to determine the pulse immunity of integrated circuits under high current and high voltage.
LANGER
The MP Scope measurement kit is a movable shielded cabin (shielded canopy) on the developer's workbench, which is used to place some sensitive measurement equipment during EFT or high-frequency detection , such as oscilloscopes, spectrum analyzers and oth
LANGER
The MP Field Source Calibration Kit is used to measure electric or magnetic fields in the frequency range up to 3GHz. RF fields or transient fields can be measured.
LANGER
The electrostatic generator calibration measurement kit is used to measure the waveform of the discharge current of the electrostatic generator. In addition, transient processes in the shape of the discharge current curve can also be measured and visualiz
LANGER
The electrostatic discharge measuring device is used to measure the electric field and the magnetic field of the electrostatic discharge generator.
LANGER
The MP CI set coupled inductance measurement kit is used to determine the EMC characteristics of connectors and cables.
LANGER
The MFA-R 0.2-75 probe uses its very small probe to directly measure the high-frequency magnetic field around the IC pins, fine conductors, or SMD devices in the smallest package on the module.
LANGER
The probe tip of the MFA-R 0.2-6 probe is very small and can be used to measure high-frequency magnetic fields on modules such as IC pins, fine conductors, or SMD devices in the smallest package.
LANGER
The MFA-K 0.1-30 near-field probe has a very small probe tip that works on the same principle as a current clamp. It can be used to measure currents on very fine conductors or IC pins, and can shield the field lines that act on the probe from the side.
LANGER
The MFA-K 0.1-12 probe has a small detector head that works on the same principle as a current clamp and can be used to measure current on fine conductors or IC pins, shielding the field lines acting on the probe from the side.
LANGER