Wisdom

Product


EMC Testing Solution Provider


Picture

Name

Description

Brand

The P1202-2 field source produces an electrostatic discharge magnetic field.

LANGER

This probe set is used to measure conducted emissions from IC pins (measured with 1 ohm/150 ohm direct coupling).

LANGER

This probe set is used to measure conducted emissions from IC pins (measured with 1 ohm/150 ohm direct coupling).

LANGER

This probe set is used for direct RF measurements of current and voltage on a single IC pin.

LANGER

The P503 probe set is used for conducted immunity measurements according to IEC 62132-4.

LANGER

The P501 probe set is used for conducted immunity measurements according to IEC 62132-4.

LANGER

The P500 probe set is used for conducted immunity measurements according to IEC 62132-4.

LANGER

The P331-2 probe set is used for conductively coupling ESD pulses into integrated circuits, and the BPS 203 pulse power station controls the probes.

LANGER

The P331 L-ESD probe set is used to conductively couple ESD pulses (200ps rise time) into integrated circuits, and the BPS 203 pulse power station controls the probes.

LANGER

 The P250 probe is used for direct contact measurements of impulse immunity of IC pins according to IEC 62215-3 and IEC 61000-4-4.

LANGER

< 1...181920...94 >
全部
  • 全部
  • 产品管理
  • 新闻资讯
  • 介绍内容
  • 企业网点
  • 常见问题
  • 企业视频
  • 企业图册