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The RF-R 50-1 type magnetic field probe is adapted to measure modules, devices or cables within a distance of about 3cm. This magnetic field probe can identify large components as potential sources of interference.

LANGER

The RF-R 3-2 type near-field probe has high resolution and is used to directly detect radio frequency magnetic fields on electronic components, such as pin areas, integrated circuit housings, wires, bypass capacitors, and other components.

LANGER

ACTC is specially designed for radiated emission testing of automotive parts and meets the requirements of DIN/ISO 11452-2 and EN 55025(CISPR 25).

FRANKONIA

The probe of the RF-R 0.3-3 magnetic field probe is small and can measure high-frequency magnetic fields with high resolution to identify the smallest components that cause interference.

LANGER

RF-K 7-4型近场探头能够测量反向进入探头的环形磁场线。

LANGER

The electrodes of the RF-E 10 electric field probe are located at the bottom of the probe and are about 0.2mm wide, which can locate the smallest electric field source, such as a 0.1mm wide wire and a single pin of a high pin count integrated circuit.

LANGER

The RF-E 09 electric field probe is used to detect the electric field generated by the surface of the multi-pin IC. Its sensitivity allows the electric field of the electronic module to be detected at a certain distance (0.5mm to 10mm).

LANGER

The electrode at the tip of the RF-E 05 probe is only 0.5mm wide, which can accurately locate the electric field generated by the main frequency line, IC pin or smaller component.

LANGER

The RF-E 04 probe is used to detect the electric field generated by the clock line and the IC surface. Its sensitivity allows the electric field of the electronic module to be detected at a certain distance (0.5mm to 10mm).

LANGER

The RF-E 02 type near field probe is used to measure the coupling electric field generated by the bus structure, the larger components or the power supply surface.

LANGER

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