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 RFS-R 3-2 near-field probe, with high resolution, is used to directly detect the radio frequency magnetic field on electronic components, such as the magnetic field of pin area, integrated circuit casing, wire, bypass capacitor and other components.

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The small tip of the RFS-R 0.3-3 magnetic field probe enables high-frequency magnetic field measurements to be made with high resolution, allowing the smallest interfering components to be identified.

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The electrodes of the RFS-E 10 electric field probe are located under the probe, about 0.2mm wide, which can locate the smallest electric field sources, such as 0.1mm wide wires, single pins of high pin count integrated circuits.

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The electrode at the tip of the RFS-E 05 probe is only 0.5mm wide, which can very accurately locate the electric field generated by main frequency lines, IC pins or small components.

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The electrodes on the bottom of the RFS-E 03 probe measure approximately 4 x 4 mm. This makes it possible to locate electric fields in cables, IC pins, or smaller components.

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The RFS-E 02 near-field probe is used to measure coupled electric fields generated by bus structures, larger components or powered surfaces.

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The measuring coil of the RFS-B 3-2 magnetic field probe is placed perpendicular to the probe handle.

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The RFS-B 0.3-3 magnetic field probe is used to detect the magnetic field lines perpendicular to the probe tip in a very small space.

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The RFS set scanner probe set includes three passive near-field probes, which are used to measure electric and magnetic fields with scanners during the research and development stage, with a frequency range of 30MHz to 3GHz.

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The preamplifier PA 306 is used to amplify the test signal, for example, the weak signal of the high-resolution near-field probe.

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