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The RFS set scanner probe set includes three passive near-field probes, which are used to measure electric and magnetic fields with scanners during the research and development stage, with a frequency range of 30MHz to 3GHz.

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The preamplifier PA 306 is used to amplify the test signal, for example, the weak signal of the high-resolution near-field probe.

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The preamplifier PA 303 is used to amplify test signals, for example weak signals from high-resolution near-field probes.

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The preamplifier PA 303 is used to amplify test signals, for example weak signals from high-resolution near-field probes.

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The preamplifier PA 303 is used to amplify test signals, for example weak signals from high-resolution near-field probes.

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 The preamplifier PA 203 is used to amplify the test signal, for example, the weak signal of the high-resolution near-field probe.

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The preamplifier PA 203 is used to amplify the test signal, for example, the weak signal of the high-resolution near-field probe.

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The RF field emission probe set consists of a magnetic field probe and an electric field probe.

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The RF field emission probe set consists of a magnetic field probe and an electric field probe.

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The P1402/P1502 probe set includes a magnetic field probe (P1402) and an electric field probe (P1502), which are used to test the anti-interference performance of integrated circuits.

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