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This probe set is used to measure 1 ohm/150 ohm conducted emissions using the direct coupling method on IC pins.

LANGER

RFS-R 50-1 is a passive near-field probe, this type of magnetic field probe is designed for on-site measurement on components, equipment or cables, the measuring distance is about 3cm.

LANGER

 RFS-R 3-2 near-field probe, with high resolution, is used to directly detect the radio frequency magnetic field on electronic components, such as the magnetic field of pin area, integrated circuit casing, wire, bypass capacitor and other components.

LANGER

The small tip of the RFS-R 0.3-3 magnetic field probe enables high-frequency magnetic field measurements to be made with high resolution, allowing the smallest interfering components to be identified.

LANGER

The electrodes of the RFS-E 10 electric field probe are located under the probe, about 0.2mm wide, which can locate the smallest electric field sources, such as 0.1mm wide wires, single pins of high pin count integrated circuits.

LANGER

The electrode at the tip of the RFS-E 05 probe is only 0.5mm wide, which can very accurately locate the electric field generated by main frequency lines, IC pins or small components.

LANGER

The electrodes on the bottom of the RFS-E 03 probe measure approximately 4 x 4 mm. This makes it possible to locate electric fields in cables, IC pins, or smaller components.

LANGER

The RFS-E 02 near-field probe is used to measure coupled electric fields generated by bus structures, larger components or powered surfaces.

LANGER

The measuring coil of the RFS-B 3-2 magnetic field probe is placed perpendicular to the probe handle.

LANGER

The RFS-B 0.3-3 magnetic field probe is used to detect the magnetic field lines perpendicular to the probe tip in a very small space.

LANGER

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