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The LF-R 400 magnetic field probe has high sensitivity due to its large diameter (25mm), and is suitable for measuring integrated circuit boards and equipment within 10cm.

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The LF 1 near-field probe set contains 4 shielded passive near-field probes, which are used to measure the long-wave, medium-wave and short-wave radio frequency magnetic fields on the electronic module during the development stage.

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The RF lead complements the deficiencies of the RF current converter, and an additional capacitive or DC connection can be established between the device under test and the GP 23 ground plate when required.

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The RF current converter can measure the high-frequency current in the line of the device under test. It directs the current to the ground plate to independently measure the synchronous current and the push-pull current.

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The RF current converter can measure the high-frequency current in the line of the device under test. It directs the current to the ground plate to independently measure the synchronous current and the push-pull current.

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The ESA 1 Electromagnetic Interference Development System is an EMC tool for measuring interference from components and equipment.

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The MS 102U magnetic field probe measures current in cables, circuits and component groups.

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Electronic equipment and electronic components will generate fast transient pulsed magnetic fields under the action of interference. The active and passive magnetic field probes included in the S2 probe set can measure these fast transient pulsed magnetic

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