EMC Testing Solution Provider

ESA1 set electromagnetic interference development system



ESA1 set electromagnetic interference development system
  • Product Description
  • Main features
  • Technical parameters
    • Commodity name: ESA1 set electromagnetic interference development system
    • Commodity ID: 1064680357996679168
    • 品牌11: LANGER
    • 描述: The ESA 1 Electromagnetic Interference Development System is an EMC tool for measuring interference from components and equipment.
    • 品牌: LANGER

      The ESA 1 Electromagnetic Interference Development System is an EMC tool for measuring the interference of components and equipment. For fast and comprehensive interference removal, the system includes a set of CS-ESA software customized according to the developer's work. This set of ESA 1 is designed for the developer's workplace. The interference emission measurements made with the ESA 1 during development are directly proportional to the far-field measurements or measurements with artificial mains networks. Use the tools in the ESA 1 system to locate the interference source and find the action path of the interference coupling. In this way, a reasonable EMC solution can be found and its dimensions can be determined. The improvement obtained with the ESA 1 is directly proportional to the far-field measurement results.

      The traditional EMI test adopts the far-field test method, and uses the electromagnetic compatibility test antenna to receive the radiation generated by the object under test (EUT). This test method must have a relatively open site and relatively expensive equipment, and it needs to be tested after the object under test is assembled into a system. Due to the existence of a large number of radio and TV station signals in the working environment, these signals are "background noise" for EMI testing. To conduct accurate testing, it must be carried out in a dark room. If testing in a normal working environment, it is necessary to take Advanced background noise filtering function [such as CASSPER virtual darkroom EMI test system].

      ESA 1 electromagnetic interference development system is a set of electromagnetic interference testing and debugging system on the experimental table. It is suitable for testing the electromagnetic interference generated by PCB during the product development stage, evaluating design modifications, improving work efficiency and speeding up product development time.

      ESA 1 electromagnetic interference development system is based on the following principles for EMI testing and debugging:

      In most cases, electromagnetic interference is not caused by a component or a signal line, but is formed by the coupling of the entire metal system of the EUT through a magnetic field or an electric field. This metal system includes the PCB and all cables and chassis connected to it. The metallic system as a whole acts as a source of interference for EMI and acts as an antenna for emitting EMI. ESA 1 tests the source of electromagnetic interference, that is, the electromagnetic interference current on the metal object, such as the current from the PCB to the cable.

      Measurements are performed on a conductive substrate, which reduces the influence of measuring devices, cable locations and ambient electromagnetic interference. Couple the interference current to the substrate through the capacitive coupling device, and then measure the current ierr on the current loop formed by the capacitive device and the substrate. This measurement method has good repeatability, so that the design modification can be correctly evaluated effectiveness.







      Typical EMI problems are generally due to the following two reasons:

      1. Common mode interference on the cable

      Generally, the power supply filtering of one or several IC chips on the PCB is not well considered, causing the ΔI noise on the power supply to be introduced into the connector and cable through the power supply or ground network, and this electromagnetic interference becomes a common mode on the cable. interference. There is also a possibility that the differential mode current loops through the connector, so that the differential mode EMI will become common mode EMI.

      For EMI testing, the impact of common-mode interference is 100 to 1000 times greater than differential-mode interference. That is to say, the interference caused by 10mA differential mode current may be the same as the interference caused by 0.1mA common mode current.

      ESA 1 can be used to easily measure the electromagnetic interference current parasitic on the power supply or ground network, and can also measure the common mode current and differential mode current respectively.

      2. Large area differential mode current loop

      Excessively long signal lines and improper current loops will generate a large area of ​​differential mode current. Far-field test results are proportional to the current loop area. In terms of measuring the area of ​​the current loop, ESA 1 must use various near-field probes to perform detailed measurements [if the EMSCAN electromagnetic interference scanning system is used, the efficiency will be higher]. But ESA 1 can easily measure the interference current intensity on the current loop, and correctly judge whether the interference current is common mode or differential mode. It has very important guiding significance for the elimination of EMI problems.

      ESA 1 contains the following accessories:

      CS-ESA set, ESA chip scanning software

      HFW 21, RF current converter

      HFA 21, RF leads

      Z23-1 set, shielding canopy (900x500x400 mm)

      PA 203 BNC, preamplifier (100KHz~3GHz)

      RF-B 0.3-3, mini magnetic field probe (30MHz~3GHz)

      RF-B 3-2, magnetic field probe (30MHz~3GHz)

      RF-E 02, electric field probe (30MHz~3GHz)

      RF-E 05, electric field probe (30MHz~3GHz)

      RF-E 10, electric field probe (30MHz~3GHz)

      RF-R 0.3-3, mini magnetic field probe (30MHz~3GHz)

      RF-R 3-2, magnetic field probe (30MHz~3GHz)

      RF-R 50-1, magnetic field probe (30MHz~3GHz)

      RF-R 400-1, magnetic field probe (30MHz~3GHz)

      RF-U 2.5-2, magnetic field probe (30MHz~3GHz)

      RF-U 5-2, magnetic field probe (30MHz~3GHz)

      ESA1 acc

      ESA1 case

      ESA1 m, Operating Instructions

  • Specific indicators:

    HFW 21 RF Current Converter

    Frequency Range

    100 kHz~1 GHz

    electric current

    10 A

    Compressive strength

    50 V

    Dimensions (LxWxH)

    (135 x 32 x 28) mm

    HFA 21 RF leads


    10 pF~100 nF

    Compressive strength

    50 V

    Shielding canopy (900x500x400 mm)

    Shielding attenuation

    45 dB~50 dB / 30 MHz~1GHz

    Dimensions (LxWxH)

    (900 x 500 x 400) mm


    12 kg

    Near Field Probe Set

    Frequency Range

    30 MHz~3 GHz

    ESA chip scanning software

    operating system

    Windows XP/Vista/7 (latest service packs)

    PA 203 preamplifier

    Frequency Range

    100 kHz~3 GHz


    20 dB


    12 V DC

    current input

    50 mA

    Maximum input power

    +13 dBm

    Frequency characteristics (details)




Get Quote


  • 全部
  • 产品管理
  • 新闻资讯
  • 介绍内容
  • 企业网点
  • 常见问题
  • 企业视频
  • 企业图册

Century Wisdom will arrange professional staff to serve you

Submit RFQ