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The XF-U 2.5-1 magnetic field probe is a near-field probe used to selectively measure high-frequency currents in wires, SMD components, and IC pins.

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The XF-R 400-1 magnetic field probe has high sensitivity due to its large diameter (25mm), allowing distance measurement modules and equipment within 10cm.

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The XF-R 100-1 magnetic field probe is used for measuring modules, equipment or cables, and can be used within 3cm from the measured object.

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XF-R Type 3-1 near-field probes for high-resolution direct detection of RF magnetic fields on components, such as pins or component areas of an IC's housing, wiring, bypass capacitors, etc.

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The electrodes on the bottom surface of the XF-E 10 electric field probe are only about 0.2mm wide and are used to locate the smallest electric fields, such as those emitted by a 0.1mm wide wire, a single pin of a high pin count integrated circuit, etc.

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This near-field probe can detect the electric field generated by IC coupling.

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This near-field probe can detect the electric field generated by IC coupling.

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The measuring coil of the XF-B 3-1 type magnetic field probe is relatively perpendicular to the probe shaft.

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The XF 1 near-field probe set consists of 4 passive magnetic field probes and 1 passive electric field probe.

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RF-U 5-2 type magnetic field probe is especially suitable for detecting the magnetic field of wide wires, cables, connectors, electronic components and their connecting ports. This magnetic field probe works like a current clamp.

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