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XF-E 10 electric field probe (30MHz ~ 6GHz)

Brand:

LANGER

XF-E 10 electric field probe (30MHz ~ 6GHz)
  • Product Description
  • Main features
  • Technical parameters
    • Commodity name: XF-E 10 electric field probe (30MHz ~ 6GHz)
    • Commodity ID: 1064698139987562496
    • 品牌11: LANGER
    • 描述: The electrodes on the bottom surface of the XF-E 10 electric field probe are only about 0.2mm wide and are used to locate the smallest electric fields, such as those emitted by a 0.1mm wide wire, a single pin of a high pin count integrated circuit, etc.
    • 品牌: LANGER

      The electrode on the bottom surface of the XF-E 10 electric field probe is only about 0.2mm wide, which is used to locate the smallest electric field, such as the electric field emitted by a 0.1mm wide wire, a single pin of a high pin count integrated circuit, etc. Place the electric field probe on the object under test during the test. This near-field probe is small and lightweight and uses sheath current attenuation. The magnetic field probe adopts electric shielding design. This near-field probe can be connected to the 50Ω input of a spectrum analyzer or oscilloscope. These near-field probes have internally mounted termination resistors.

  • Specific indicators:

    Frequency Range

    30 MHz~6 GHz

    resolution

    ≈ 0.2 mm

    Probe size

    ≈ (0.5 x 2) mm

    Output Interface

    SMA

    Frequency characteristics [dBµV] / [dBµV/mm]

    LONGER

    Electric field correction curve [dBµV/mm] / [dBµV]

    LONGER

     

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