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The compact size of the Mini Burst Generator can be used to eliminate electromagnetic weak points of electronic components during the development process. At the top of the generator, a burst interference field and an electrostatic discharge interference

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OSE 450 transmits the digital signal from the disturbed DUT to the oscilloscope. It has four separate sensors, which are used to detect four digital signals in the object under test. It is connected to a receiving end of the oscilloscope through four opti

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Digital signals under the influence of EFT/Burst interference can be displayed on the oscilloscope with zero potential by means of OSE 150-2. The OSE 150-2 is able to quickly identify disturbed signals. It has two separate sensors, which are used to detec

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OSE 150-1 transmits the digital signal from the object under test affected by EFT/Burst interference to the oscilloscope. The probe contains a sensor that detects a logic signal and converts the logic signal into an optical signal. It is connected to the

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The LIN 100 fiber optic fieldbus can transmit signals potential-free according to the LIN standard. The probe is very small and can be placed directly on the component group when in use. The bus is a double-layer optical fiber, so it has a bidirectional o

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BS 06DB-s type magnetic field source is used to generate electric fast transient burst magnetic field. The electric fast transient burst current signal is injected into the field source through a high-voltage cable and an electric fast transient burst gen

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Different types of field source probes meet various test needs, can be precisely positioned to the millimeter level, and can detect critical connection points on the interference path, such as components, wires or IC pins.

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In the anti-interference test, the E field source and the B field source of the sensitive point are searched. The field source group includes 3 B-field source probes, 3 E-field source probes, high-voltage cables and packing boxes.

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