H3 set the field source group-Century Wisdom (Suzhou) Testing Technology Co., Ltd

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H3 set the field source group

Brand:

LANGER

Product Description
Main features
Technical parameters

Commodity name: H3 set the field source group
Commodity ID: 1064487282632445952
品牌11: LANGER
描述: Different types of field source probes meet various test needs, can be precisely positioned to the millimeter level, and can detect critical connection points on the interference path, such as components, wires or IC pins.
品牌: LANGER

　　Different types of field source probes meet various test needs, can be precisely positioned to the millimeter level, and can detect critical connection points on the interference path, such as components, wires or IC pins. In the anti-interference test, the E field source and the B field source of the sensitive point are searched. The field source group includes 4 B-field source probes, 5 E-field source probes, high-voltage cables and packing boxes.

principle:

　　In the anti-interference test, it is required to apply an interference voltage to the device under test, or apply an interference current through some specified coupling methods. These interference signals will be applied to the cables, chassis or connectors of the equipment under test, thus generating pulsed electric and magnetic fields. If some unit circuits inside the device under test cannot resist these interferences, the device cannot pass the EMC test. The field source group includes field source probes of various sizes, from large to small, to quickly locate sensitive points.

application	describe	design
	BS 02-h magnetic field source is mainly used for weak point location in circuit layout. It produces a magnetic field beam covering a diameter of about 5 cm, which can act on the surface of the circuit casing and its internal area, connecting parts, modules with wires, and integrated circuits in a large area, so as to identify weak points sensitive to magnetic fields and positioning. Probe size: > 5 cm
	The BS 04DB-h type magnetic field source produces a magnetic field with a diameter of approximately 3 mm. The surface of the printed circuit board can be sampled by means of the magnetic field emitted from its front side, which eliminates magnetic weak points in the circuit layout and assembly areas. It is also possible to locate critical conductor segments, critical components and the connections of these components. Probe size: 1 mm - 3 mm
	The BS 05DB-h type magnetic field source emits a small magnetic field with a diameter of about 1mm from the tip of its probe, so it is suitable for locating point-shaped weak points. The surface of printed circuit boards and components can be sampled by means of the tiny magnetic field it emits. High resolution due to the tiny diameter of the probe and the precise binding of the generated magnetic field. Probe size: 1 mm - 3 mm
	The magnetic field source type BS 05DU-h generates a tiny magnetic field with a diameter of about a few millimeters at its tip. It works like a coupling clamp to selectively couple disturbing currents to individual conductors, IC pins, components, and thin wires (flat ribbon cables).
	Electric field sensitive points can be located over a large area with the help of the ES 00-h electric field source. Usually these sensitive areas reach 1-15cm on components such as LCD displays and bus systems. The electric field source type ES 00-h can also be used to couple interference currents, e.g. in component cables.
	ES 01-h type electric field source can realize electric coupling in a wide range. This field source is suitable for applying electric field disturbance to weak points in the range of 5 to 10 cm. It is between ES 00-h type and ES 02-h type electric field source.
	The ES 02-h field source has a large area and can apply a coupling interference electric field to the surface of the chassis, connectors, modules with conductor structures, and integrated circuits (such as bus systems, liquid crystal displays) in a wide range. The tip of this field source can also be used to locate smaller structures that are sensitive to electric fields (wires, crystals, pull-up resistors, ICs, etc.).
	The ES 05D-h electric field source has a narrow decoupling electrode inside the probe. Therefore, it is suitable for applying electric fields to wires, small component machine connectors, cables and individual components. It can also be used to measure individual connectors or cores of flat ribbon cables.
	The electric field source type ES 08D-h is a probe for checking the sensitivity of IC pins or wiring etc. When testing, the tip of the probe is connected to the pin or wiring, and the sensitivity of the pin is detected by changing the intensity of the interference pulse of the EFT or burst generator. Inside the field source, interfering pulses are capacitively coupled to the probe so that they do not affect the valid signal.

main feature:

　　Noise-sensitive defects can be located very precisely;

　　Can be used for sensitive defect location of modules, components, conductors and integrated circuits;

　　Easy to use, pen-style hand-held, and the connector adopts a buckle method.