Wisdom
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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
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Automotive Electronic EMC Test System
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- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
-
Automotive Electronic EMC Test System
-
- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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-
- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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Product
EMC Testing Solution Provider
Picture
Name
Description
Brand
The MFA-K 0.1-30 near-field probe has a very small probe tip that works on the same principle as a current clamp. It can be used to measure currents on very fine conductors or IC pins, and can shield the field lines that act on the probe from the side.
LANGER
The MFA-K 0.1-12 probe has a small detector head that works on the same principle as a current clamp and can be used to measure current on fine conductors or IC pins, shielding the field lines acting on the probe from the side.
LANGER
The two microprobes of the MFA 02 SET microprobe set can measure magnetic fields with a magnetic field frequency within 1GHz, such as on signal lines, SMD-components, and integrated circuit pins.
LANGER
The MFA 01 SET probe set has high resolution and excellent performance in magnetic field measurement. It can measure magnetic fields in the frequency range below 6GHz. Such as signal lines, SMD components or integrated circuit board pins.
LANGER
The measuring coil of the LFS-B 3 magnetic field probe is relatively perpendicular to the probe shaft. When the probe is placed upright on the circuit board, its measuring coil lies directly on the surface of the circuit board.
LANGER
The ICT1 integrated circuit tester is a positioning system for integrated circuit measurement equipment produced by Langer Company, which is used for automatic EMC testing on integrated circuits.
LANGER
ICS 105 integrated circuit scanner for high-frequency near-field measurements of integrated circuits and small components.
LANGER
The probe measures the magnetic field with high resolution and sensitivity. The effect is best when the distance to be measured is less than 1mm.
LANGER
The probe measures the magnetic field with high resolution and sensitivity. The effect is best when the distance to be measured is less than 1mm.
LANGER
The probe measures the magnetic field with high resolution and sensitivity. The effect is best when the distance to be measured is less than 1mm.
LANGER