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EMC Testing Solution Provider

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MFA-R 0.2-6 miniature near-field probe (100MHz-6GHz)

MFA-R 0.2-6 miniature near-field probe (100MHz-6GHz)

The probe tip of the MFA-R 0.2-6 probe is very small and can be used to measure high-frequency magnetic fields on modules such as IC pins, fine conductors, or SMD devices in the smallest package.

LANGER

MFA-K 0.1-30 miniature near-field probe (1MHz-1GHz)

MFA-K 0.1-30 miniature near-field probe (1MHz-1GHz)

The MFA-K 0.1-30 near-field probe has a very small probe tip that works on the same principle as a current clamp. It can be used to measure currents on very fine conductors or IC pins, and can shield the field lines that act on the probe from the side.

LANGER

MFA-K 0.1-12 miniature near-field probe (100MHz-6GHz)

MFA-K 0.1-12 miniature near-field probe (100MHz-6GHz)

The MFA-K 0.1-12 probe has a small detector head that works on the same principle as a current clamp and can be used to measure current on fine conductors or IC pins, shielding the field lines acting on the probe from the side.

LANGER

MFA 02 set miniature probe set (100 MHz-1 GHz)

MFA 02 set miniature probe set (100 MHz-1 GHz)

The two microprobes of the MFA 02 SET microprobe set can measure magnetic fields with a magnetic field frequency within 1GHz, such as on signal lines, SMD-components, and integrated circuit pins.

LANGER

MFA 01 set miniature probe set (1 MHz-6 GHz)

MFA 01 set miniature probe set (1 MHz-6 GHz)

The MFA 01 SET probe set has high resolution and excellent performance in magnetic field measurement. It can measure magnetic fields in the frequency range below 6GHz. Such as signal lines, SMD components or integrated circuit board pins.

LANGER

LFS-B 3 Scanner Magnetic Field Probe (100 kHz-50 MHz)

LFS-B 3 Scanner Magnetic Field Probe (100 kHz-50 MHz)

The measuring coil of the LFS-B 3 magnetic field probe is relatively perpendicular to the probe shaft. When the probe is placed upright on the circuit board, its measuring coil lies directly on the surface of the circuit board.

LANGER

ICT1 set integrated circuit automatic tester

ICT1 set integrated circuit automatic tester

The ICT1 integrated circuit tester is a positioning system for integrated circuit measurement equipment produced by Langer Company, which is used for automatic EMC testing on integrated circuits.

LANGER

ICS 105 set four-axis positioning IC scanner

ICS 105 set four-axis positioning IC scanner

ICS 105 integrated circuit scanner for high-frequency near-field measurements of integrated circuits and small components.

LANGER

ICR HV500-75 Near Field Microprobe

ICR HV500-75 Near Field Microprobe

The probe measures the magnetic field with high resolution and sensitivity. The effect is best when the distance to be measured is less than 1mm.

LANGER

ICR HV500-6 Near Field Microprobe

ICR HV500-6 Near Field Microprobe

The probe measures the magnetic field with high resolution and sensitivity. The effect is best when the distance to be measured is less than 1mm.

LANGER

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Century Wisdom (Suzhou) Testing Technology Co., Ltd

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