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AHS PAM-2640 preamplifier series can improve the sensitivity of the overall system by at least 20dB.

AHS

AHS PAM-1840VH preamplifier series can improve the overall system sensitivity by at least 33dB.

AHS

AHS PAM-1840 preamplifier series can improve the sensitivity of the overall system by at least 15dB.

AHS

XFS-R 3-1 magnetic field probe is suitable for close-range measurement of components with high magnetic field strength. The scanning probe can be connected to the 50Ω input of a spectrum analyzer or oscilloscope .

LANGER

The XFS-E 10 probe is a passive near-field probe, usually the probe is placed directly on the object to be measured (high electric field strength). The scanning probe can be connected to the 50Ω input of a spectrum analyzer or oscilloscope .

LANGER

XSF-E 09 is a passive near-field detector. During the measurement, the electric field probe is positioned above the components and the printed circuit board. The scanning probe can be connected to the 50Ω input of a spectrum analyzer or oscilloscope .

LANGER

The XFS-B 3-1 is a passive near-field probe that detects magnetic field lines emitted at 90° from the measured object.

LANGER

 The SX-R 20-1 is a passive magnetic field probe covering a frequency range up to 20GHz.

LANGER

The SX-R 20-1 consists of a passive near-field probe for measuring magnetic fields at high clock frequencies up to 20 GHz on electronic components and integrated circuits during the development phase.

LANGER

The small size of the SX-R 3-1 magnetic field probe is used for high-resolution measurement of high-frequency magnetic fields, thus enabling the identification of the smallest components as potential sources of interference.

LANGER

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