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E1 set anti-jamming development system

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LANGER

E1 set anti-jamming development system
  • Product Description
  • Main features
  • Technical parameters
    • Commodity name: E1 set anti-jamming development system
    • Commodity ID: 1064486515636850688
    • 品牌11: LANGER
    • 描述: E1 anti-interference development system is a set of EMC tool system for anti-interference analysis in the development process of integrated circuit boards. The E1 anti-interference development system can quickly and accurately locate the cause (weak point
    • 品牌: LANGER

      E1 anti-interference development system is a set of EMC tool system for anti-interference analysis in the development process of integrated circuit boards. The E1 anti-interference development system can quickly and accurately locate the cause (weak point) of burst interference and electrostatic discharge interference, enabling engineers and developers to accurately design appropriate EMC measures for weak points, and use E1 to evaluate the effect of EMC measures. The E1 testing equipment has a small building space and is suitable for use in the workplace of electronic component developers. The E1 user manual gives a detailed description of the EMC working mechanism and the basic measurement strategy for IC board interference removal. The E1 kit includes a burst and ESD generator, nine different electric and magnetic field sources, and various other accessories.

      

    E1 anti-interference

  • main feature:

      Interference is directly applied to the PCB through the SGZ21 generator, and the interference current path is analyzed;

      Use the field source to locate the fault point;

      Measure the magnetic burst field to track the disturbance current;

      Monitor key logic signals on the PCB;

      Reproduce problems that arise during standard tests, analyze disturbing current paths;

      With the help of field sources, locate wiring and devices susceptible to interference;

      Critical logic signals can be monitored and magnetic interference fields can be measured.

     

     

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