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 The preamplifier PA 203 is used to amplify the test signal, for example, the weak signal of the high-resolution near-field probe.

LANGER

The preamplifier PA 203 is used to amplify the test signal, for example, the weak signal of the high-resolution near-field probe.

LANGER

The RF field emission probe set consists of a magnetic field probe and an electric field probe.

LANGER

The RF field emission probe set consists of a magnetic field probe and an electric field probe.

LANGER

The P1402/P1502 probe set includes a magnetic field probe (P1402) and an electric field probe (P1502), which are used to test the anti-interference performance of integrated circuits.

LANGER

The current probe calibration fixture is used to calibrate the large current injection probes CLCI-100, CLCI-400 and current probes CLCE-400, CLCE-452.

COMPOWER

The PS-500 is a near-field probe set consisting of four probes and a custom storage case.

COMPOWER

The PS-400 is a near-field probe set consisting of three probes and a custom storage case.

COMPOWER

The PAP-501 is a general-purpose, broadband, high-gain, benchtop preamplifier.

COMPOWER

The PAM-6000 is a general-purpose, broadband, high-gain, benchtop preamplifier.

COMPOWER

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