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ICI 01 L-EFT a magnetic field source to couple fast transient pulses into the integrated circuit through the magnetic field, so it can selectively test a certain area of the integrated circuit for interference immunity.

LANGER

Integrated circuit test systems are designed to measure radiated or conducted interference from integrated circuits.

LANGER

H4-IC set-type magnetic field sources are used to generate electrical fast transient burst magnetic fields.

LANGER

The FLS 106 PCB Scanner is designed to facilitate the near-field probe to detect the magnetic or electric field of an electronic component group. The combination of scanner and near-field probe series (from SX to LF) can measure electric or magnetic field

LANGER

The FLS 106 IC scanner enables high-resolution (50-100µm) measurements of high-frequency magnetic or electric fields up to 6GHz with the help of the ICR-near-field microprobe on top of the integrated circuit of the electronic assembly.

LANGER

The D10 series is designed by LANGER for demonstration products

LANGER

ChipScan-Scanner software is used to automatically measure the near electric and near magnetic fields of electronic components.

LANGER

The CS-ESA chip scanning software is used to remotely control the spectrum analyzer, store and record the measurement curve.

LANGER

The canopy rod is made of metal and is used as the base bracket of the shielding canopy and is inserted into the GP 23 grounding plate.

LANGER

The RF sealing of the shielded tent is achieved by a smooth running magnetic sealing strip.

LANGER

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