Wisdom

Product


EMC Testing Solution Provider


Picture

Name

Description

Brand

This near-field probe can detect the electric field generated by IC coupling.

LANGER

The measuring coil of the XF-B 3-1 type magnetic field probe is relatively perpendicular to the probe shaft.

LANGER

The XF 1 near-field probe set consists of 4 passive magnetic field probes and 1 passive electric field probe.

LANGER

RF-U 5-2 type magnetic field probe is especially suitable for detecting the magnetic field of wide wires, cables, connectors, electronic components and their connecting ports. This magnetic field probe works like a current clamp.

LANGER

The RF-U 2.5-2 magnetic field probe is a near-field probe used to detect RF current in wires, component pins, SMD components, and integrated circuit pins.

LANGER

The RF-R 400-1 magnetic field probe has high sensitivity due to its large diameter (25mm), and is suitable for distance detection modules and equipment within 10cm.

LANGER

The RF-R 50-1 type magnetic field probe is adapted to measure modules, devices or cables within a distance of about 3cm. This magnetic field probe can identify large components as potential sources of interference.

LANGER

The RF-R 3-2 type near-field probe has high resolution and is used to directly detect radio frequency magnetic fields on electronic components, such as pin areas, integrated circuit housings, wires, bypass capacitors, and other components.

LANGER

The probe of the RF-R 0.3-3 magnetic field probe is small and can measure high-frequency magnetic fields with high resolution to identify the smallest components that cause interference.

LANGER

The electrodes of the RF-E 10 electric field probe are located at the bottom of the probe and are about 0.2mm wide, which can locate the smallest electric field source, such as a 0.1mm wide wire and a single pin of a high pin count integrated circuit.

LANGER

< 1...101112...17 >
全部
  • 全部
  • 产品管理
  • 新闻资讯
  • 介绍内容
  • 企业网点
  • 常见问题
  • 企业视频
  • 企业图册