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The ICI E450 L-EFT pulsed electric field source couples fast transient pulses to the test IC (open chip). A partial area of the integrated circuit can be tested for immunity.

LANGER

The ICI03L-EFT device consists of 3 different ICI sources emitting electric field, magnetic field and current pulses. High-precision and very high-resolution analysis of integrated circuits, such as testing safety-critical circuits.

LANGER

ICI 01 L-EFT a magnetic field source to couple fast transient pulses into the integrated circuit through the magnetic field, so it can selectively test a certain area of the integrated circuit for interference immunity.

LANGER

Integrated circuit test systems are designed to measure radiated or conducted interference from integrated circuits.

LANGER

H4-IC set-type magnetic field sources are used to generate electrical fast transient burst magnetic fields.

LANGER

The FLS 106 PCB Scanner is designed to facilitate the near-field probe to detect the magnetic or electric field of an electronic component group. The combination of scanner and near-field probe series (from SX to LF) can measure electric or magnetic field

LANGER

The FLS 106 IC scanner enables high-resolution (50-100µm) measurements of high-frequency magnetic or electric fields up to 6GHz with the help of the ICR-near-field microprobe on top of the integrated circuit of the electronic assembly.

LANGER

The D10 series is designed by LANGER for demonstration products

LANGER

ChipScan-Scanner software is used to automatically measure the near electric and near magnetic fields of electronic components.

LANGER

The CS-ESA chip scanning software is used to remotely control the spectrum analyzer, store and record the measurement curve.

LANGER

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