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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
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Automotive Electronic EMC Test System
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- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
-
Automotive Electronic EMC Test System
-
- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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Technical column
CASES
Why domestic equipment lags behind imported equipment
Release time:
2013-03-05 00:00
Source:
Compared with imported equipment, domestic equipment is not only insufficient in technology and experience, but also has a relatively large gap in concepts, standards and ideas.
According to statistics, the test instrument industry accounts for less than 2% of the output value of the electronics industry, while the output value of the electronics industry only accounts for about 2% of the world's total output value, but the added value brought by new technologies driven by test instruments can account for the entire world. 70% to 75% of the world's annual added value. As a basic product and technology that has been applied from basic research to production lines, the strength of the electronic testing instrument industry can completely stimulate the added value driven by innovation in a country.
However, in such a seemingly small but hugely influential industry, China has always played a supporting role on the stage. Regardless of national defense or civilian needs, the test systems and test instruments we come into contact with are all imported brands in high-performance applications.
Experts and scholars from aerospace systems, military academies and the military's first-line test system research and development, application and metrology research believe that as a high-tech, capital-intensive, cross-disciplinary industry that emphasizes years of technology accumulation, China's testing instruments The gap between my country and foreign companies is multifaceted, not only the lack of technology, experience and funds, but more importantly the gap in concepts, standards and ideas and insufficient attention to decision-making.
technology gap
Experts in the industry believe that for domestic testing instruments, we are always learning and catching up with others. This is the biggest problem in technology. For example, in recent years, in military testing, various bus technologies are prevalent. However, these bus technologies are all defined and developed by foreign countries, which means that if China wants to apply these bus technologies, it cannot escape the tests defined by them. System architecture and test methods, in most cases we have to buy their products to meet the domestic test system requirements.
If we say that in terms of these system-level test instruments, the technical gap is relatively small because of the open bus, then in terms of desktop instruments, the gap between domestic and foreign countries is almost difficult to estimate. People in the industry believe that for basic testing instruments, its architecture and concepts are not difficult to understand, but when it comes to specific function definitions and product function realization, there is a big gap between us, which makes China's testing instrument development It is an embarrassing cycle with the application: we cannot track the cutting-edge technology of advanced electronic technology development, so we have no way to understand its test requirements, and naturally we cannot develop test instruments suitable for the latest technology, let alone grasp the latest technology. Test the pulse of the market and earn the most lucrative part of the profit; but if you can’t test advanced new technologies, you won’t be able to catch them when they appear, and it’s impossible for others to entrust you to meet the initial testing needs. It is impossible to understand the latest technological trends, and it is impossible to apply new technologies to your test instruments.
It is understood that in application testing, a more important problem restricting the application of local test instruments comes from the lack of core semiconductor devices: domestic test instrument companies, whether old state-owned research institutes or emerging private test instrument companies, have their own chips. Compared with international giants, there is a big gap in research and development capabilities. It can be said that it is difficult to find relevant and suitable products in the market because of the special requirements of the chip used for testing, especially in terms of signal analysis and signal acquisition. The lack of analog front-end technology and signal acquisition technology is directly reflected in the domestic The test equipment cannot capture some of the required characteristic signals, such as most of the requirements of radar and microwave technology, and commercial chips cannot meet their test requirements. There is no related semiconductor device that can produce products that meet these sampling rate and bandwidth requirements, and these two points are precisely the premise of many signal analysis and signal processing in practical applications.
concept gap
"Smoothing the gap in technology is not something that can be achieved overnight. But compared with the gap in technology, the gap in our concepts and thinking on testing instruments is even greater." An expert from the field of metrology research said.
According to reports, testing equipment is a capital-intensive enterprise, and the production scale of the company is very important. Testing equipment is an industry with a relatively small market. Because there are many types of equipment, the market for a single type of equipment is bound to be unlikely to be large. This makes it more difficult for Chinese companies to catch up. On the one hand, as a technology-intensive and accumulative industry, in the face of so many foreign competitors who are already far ahead, it is necessary to have enough testing instruments to make them bigger and stronger. investment, and don't expect returns in the short term. It is undoubtedly difficult for some private companies to have such strong financial resources to support this point. Therefore, it is necessary to have a national strategic plan and strong support from relevant resources to have the opportunity to continuously narrow the gap.
On the other hand, because the market is small, it is more important to emphasize the continuity and focus of enterprise R&D. For domestic private companies, they are facing pressure to survive, and for many state-owned scientific research institutes, they are also Faced with research on income generation indicators and various cutting-edge topics, it is impossible to focus on intensive cultivation of one or two types of products.
Furthermore, because of the complex market segmentation, it is difficult to reflect the short-term significance of the research on the architecture and concept of testing instruments, which makes some research institutions that originally supported their research on the architecture and concepts of testing instruments strategically no longer willing to devote their energy Focusing on this, but pursuing other jobs with better short-term benefits, as a result, only various instrument manufacturers develop these general basic concepts by themselves, resulting in repeated waste of many R&D resources.
Some experts from the aerospace field believe that another deficiency of the domestic instrument industry is service. It can be said that as an industry with a gross profit margin of more than 50%, a large part of the company's sales profits are used to provide high-quality market cultivation, after-sales service and technical support. Especially in terms of user testing experience and testing habits, the gap in awareness between domestic companies and international companies is too far.
Some domestic test instrument manufacturers said that their product performance is similar to that of foreign competitors, but the user interface and operation are too far apart in terms of versatility, and the publicity among users is almost zero. When users have corresponding testing needs, even if the cost performance and other indicators of the two products are completely different, it is difficult for users to choose their products and give up foreign products. There is only one reason: users will use them.
"The testing and measurement and instrument industry is a necessary guarantee for some important domestic fields, and it is also a sharp tool for the research and development of cutting-edge technology. At the same time, it is an important link that cannot be avoided by any electronic technology." Experts in the industry appealed that although the problem of testing instruments is basic, But it is not a small problem. It is a concentrated expression of the country's inadequacy in software and hardware. To solve the problem of backward testing instruments, it requires the joint efforts of state-owned scientific research institutions and enterprises, as well as private and private enterprises. It requires a comprehensive approach from standards to architecture to concepts. The gradual establishment of a series of test systems.