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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
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Automotive Electronic EMC Test System
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- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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EMC Test System For Civil Products
-
- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
-
Automotive Electronic EMC Test System
-
- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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Technical column
CASES
High current injection test method
Release time:
2022-07-29 00:00
Source:
1 Introduction
In recent years, with the development of automobiles in the direction of electrification, intelligence and networking, more and more electronic devices are integrated in the limited space of automobiles, and these electronic devices also bring more and more electromagnetic compatibility problems. In order to deal with electromagnetic compatibility problems, electronic components must be tested for electromagnetic compatibility before they are installed on the vehicle. Among them, the Bulk Current Injection (BCI) method only needs to be carried out in a shielded room, and the cost is much lower than that of the radiation immunity that must be carried out in an anechoic chamber. At the same time, it does not invade the device under test, so it has become the first choice for electronic component verification. Required method. The large current injection (BCI) method is a method of using a current injection probe to directly couple the disturbance signal to the wiring harness for immunity testing. The injection probe is a current transformer through which the wiring harness of the equipment under test (EUT) is passed. The immunity test is carried out by changing the severity level of the test and the frequency of the induced disturbance.
2. High current injection test method
The test method for immunity test using the large current injection method is generally divided into substitution method and closed-loop method.
The substitution method means that after using the current injection clamp calibration device to obtain the signal source level corresponding to the corresponding test level, the signal source level is directly output during the test. It is required to place injection clamps at three positions 150mm, 450mm and 750mm away from the EUT for testing. As shown in Figure 1.

Figure 1 BCI trial layout - alternative method
The closed-loop method refers to: after using the current injection clamp calibration device to obtain the signal source level corresponding to the corresponding test level (record the net power at this time as the calibration power), use the current probe to monitor the actual injected current during the test. The power is 4 times greater than the calibration power, and the measured injection current still does not reach the current specified in the standard, so stop increasing the injection power. It is required that the injection clamp be placed at a distance of 900mm from the EUT, and the current probe at a distance of 50mm. As shown in Figure 2.

Figure 2 BCI test layout - closed loop method
The substitution method and the closed-loop method have the following differences:
A, the length of the test harness for the alternative method is 1700mm, and the length of the test harness for the closed-loop method is 1000mm;
B, The current injection position of the substitution method is 150mm, 450mm, 750mm, while the current injection position of the closed-loop method is 900mm;
C, the closed-loop method must use a current monitoring probe, the probe is located at 50mm, and the current monitoring probe is generally not used in the substitution method test;
D, The substitution method is an open-loop test based on a given injection power, while the closed-loop method is a closed-loop test that is monitored in real time by a current monitoring probe.
3 Test device
The test needs to be carried out in a shielded room, and the main test equipment required are: signal source (with modulation function), power amplifier, power meter, artificial power network, current injection probe, current injection probe calibration fixture, current monitoring probe, etc. Figure 3 is a block diagram of the test system connection.

Figure 3 BCI test system connection block diagram
4 Test arrangement
In the layout of the test platform, the equipment under test and the wiring harness are placed 50mm above the ground plane. The ground plane should be made of copper, brass or galvanized steel with a thickness of at least 0.5mm. The minimum width is 1000mm, the minimum length is 2000mm, or 200mm larger than the sides of the entire device, whichever is larger. The height of the grounding plane (test bench) should be located at (900±100) mm above the ground, the grounding plane is electrically lapped with the shielding shell, the distance between the grounding copper strips is 300mm, and the DC resistance shall not exceed 2.5mΩ. The material with a thickness of 50mm and a relative dielectric constant (≤ 1.4) is used as a support between the wiring harness and the copper plate. The power supply supplies power to the device under test through two artificial source networks, one of which is connected to the positive pole of the power supply and the other is connected to the negative pole of the power supply. Figure 4 and Figure 5 are the layout of the test.

Figure 4 Test arrangement - side view

Figure 5 Test Layout - Top View
5 Test process
5.1 Alternative method test process
An alternative method uses forward power as a reference for calibration and testing, using an unmodulated sine wave for calibration.
5.1.1 Calibration
Calibrate according to the specified test level (current), and record the forward power required to produce the specified current on the 50Ω calibration fixture at each test frequency. One end of the calibration fixture is connected to a 50Ω load (high power), the other end is connected to a 50Ω RF power meter, and a 50Ω attenuator of corresponding power is connected in series to protect the power meter. Apply a test signal level to the fixture and record the corresponding forward power. This method calibrates the relationship between the predetermined power and current of the large current injection system before the test. As shown in Figure 6.

Figure 6 Alternative Method Calibration Arrangement
5.1.2 Testing
When testing the EUT after the wiring harness is connected, a predetermined power is applied to the injection probe. It should be noted that the monitored power for injection into the probe is a predetermined power. The test setup is shown in Figure 1.
5.2 Closed-loop test process
The closed-loop method uses forward power as a reference for calibration and testing, and uses an unmodulated sine wave for calibration.
5.2.1 Calibration
Used to determine the power limit for EUT testing. Calibrate before the test according to the specified test level (current), and determine the forward power required to generate the specified current on the 50Ω calibration fixture for each test frequency. One end of the calibration fixture is connected to a 50Ω load (high power), the other end is connected to a 50Ω RF power meter, and a 50Ω attenuator of corresponding power is connected in series to protect the power meter. Apply a test signal level to the fixture and record the corresponding forward power. This method calibrates the relationship between the predetermined power and current of the large current injection system before the test. As shown in Figure 6.
5.2.2 Testing
During the test, use a current probe to monitor the actual injected current. If the injected power is 4 times greater than the calibrated power and the measured injected current still does not reach the current specified in the standard, stop increasing the injected power. The test layout is shown in Figure 2.