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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
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Automotive Electronic EMC Test System
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- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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EMC Test System For Civil Products
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- Electrostatic Discharge Immunity
- Radiated, radio-frequency,electromagnetic field immunity
- Electrical Fast Transient Burst Immunity
- Surge immunity
- Immunity To Conducted Disturbance Induced by Radio Frequency Field
- Power Frequency Magnetic Field Immunity
- Voltage dips, short interruptions and voltage variations immunity
- Harmonics and interharmonics including mains signalling at AC power port, low frequency immunity
- Voltage Fluctuation Immunity Test
- Common mode disturbances in the frequency range 0 Hz to 150 kHz Immunity
- Ripple on DC input power port immunity
- Three-phase Voltage Unbalance Immunity Test
- Power Frequency Variation Immunity Test
- Oscillatory Wave Immunity Test
- Damped Oscillatory Magnetic Field Immunity Test
- Differential mode disturbances immunity test
- DC power input port voltage dip, short interruption and voltage variations test
-
Automotive Electronic EMC Test System
-
- Electrostatic Discharge Immunity
- Electrical Transient Conducted Immunity
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Anechoic Chamber Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Transverse Wave (TEM) Cell Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-large Current injection (BCI) method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Stripline Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-direct Injection Of Radio Frequency (RF) Power
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Magnetic Field Immunity Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Portable Transmitter Simulation Method
- Immunity Test To Narrowband Radiated Electromagnetic Energy-Conduction Immunity Method For Extended Audio Range
- High Voltage Electrical Performance ISO 21498-2 Test System
- High Voltage Transient Conducted Immunity (ISO 7637-4)
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- CE101(25Hz ~ 10kHz power line conduction emission)
- CE102(10kHz ~ 10MHz power line conduction emission)
- CE106(10kHz ~ 40GHz antenna port conducted emission)
- CE107 (Power Line Spike (Time Domain) Conducted Emission)
- RE101(25Hz ~ 100kHz magnetic field radiation emission)
- RE102(10kHz ~ 18GHz electric field radiation emission)
- RE103(10kHz ~ 40GHz antenna harmonic and spurious output radiated emission)
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- CS101(25Hz ~ 150kHz power line conduction sensitivity)
- CS102(25Hz ~ 50kHz ground wire conduction sensitivity)
- CS103(15kHz ~ 10GHz Antenna Port Intermodulation Conducted Sensitivity)
- CS104(25Hz ~ 20GHz antenna port unwanted signal suppression conduction sensitivity)
- CS105(25Hz ~ 20GHz antenna port intermodulation conduction sensitivity)
- CS106 (Power Line Spike Signal Conduction Sensitivity)
- CS109(50Hz ~ 100kHz shell current conduction sensitivity)
- CS112 (Electrostatic Discharge Sensitivity)
- CS114(4kHz ~ 400MHz cable bundle injection conduction sensitivity)
- CS115 (Conduction sensitivity of cable bundle injection pulse excitation)
- CS116(10kHz to 100MHz Cable and Power Line Damped Sinusoidal Transient Conduction Sensitivity)
- RS101(25Hz ~ 100kHz magnetic field radiation sensitivity)
- RS103(10kHz ~ 40GHz electric field radiation sensitivity)
- RS105 (Transient Electromagnetic Field Radiated Susceptibility)
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Technical column
CASES
What are the characteristics of EMC system integration?
Release time:
2022-10-13 11:46
Source:
EMC system integration manufacturers believe that active devices in hybrid circuits generally use bare chips, and when bare chips are not available, the corresponding package chips can be used. In order to obtain the appropriate EMC characteristics, surface mount chips should be used as much as possible. When choosing a chip, under the premise of meeting the technical specifications of the product, try to choose a low-speed clock, never use AC when you can use HC, and CMOS4000 can work without HC. Capacitors should have a low equivalent series resistance, which can avoid large attenuation of the signal. The package of the hybrid circuit can use the base and cover of the fungible metal, which can be welded in parallel and shielded well.

EMC system integration manufacturers believe that when dividing the layout of a hybrid microcircuit, there are three main factors to consider first: the number of input/output pins, device density and power consumption. A practical rule is that the area of the chip components is 20% of the substrate, and the power consumption per square inch does not exceed 2W.
EMC system integration manufacturers believe that in principle, related devices should be placed as close as possible to each other in terms of device layout, digital circuits, analog circuits, and power circuits should be placed separately, and high-frequency circuits should be separated from low-frequency circuits. Devices susceptible to noise, small-current circuits, high-current circuits, etc. should be as far away from the logic circuit as possible. Clock circuits, high frequency circuits, and other major sources of interference and radiation should be placed independently, away from sensitive circuits. Input chips should be located near the I/O outlets of the mixed circuit package. High-frequency components should be connected as short as possible to reduce distribution parameters and mutual electromagnetic interference. Components susceptible to interference should not be too close to each other, and inputs and outputs should be as far away as possible.
EMC system integration manufacturers believe that oscillators should be located as close as possible to the location where clock chips are used and away from signal interfaces and low-level signal chips. Components should be parallel or perpendicular to the side of the substrate, components should be arranged as parallel as possible, so as to reduce the distribution parameters between the components, but also in line with the manufacturing process of hybrid circuits, easy to produce. On the hybrid circuit substrate, the lead pads for power and ground should be arranged symmetrically, and multiple I/O connections for power and ground should be distributed as evenly as possible. The mounting area of the bare chip is connected to the most negative potential plane.
EMC system integration manufacturers believe that when a multilayer hybrid circuit is elected, the sandwich arrangement of the board varies depending on the specific circuit, but generally has the following characteristics.
(1) power and ground layers are distributed in the inner layer, which can be regarded as a shielding layer, which can well suppress the common mode RF interference inherent in the circuit board and reduce the distributed impedance of high frequency power.
(2) the board power supply layer and ground layer as close as possible to each other, ground layer is generally above the power supply layer, so that the interlayer capacitance can be used as a power supply smoothing capacitance, while the ground layer can shield the radiation current distributed in the power supply layer.
(3) The wiring layer should be arranged as close as possible to the power supply or grounding layer to produce flux offset.