Dongfeng Liuqi Passenger car parts electromagnetic compatibility specification Specification introduction QLQB C-208_Century Wisdom (Suzhou) Testing Technology Co., Ltd

English

Home page

Technical column

CASES

Dongfeng Liuqi Passenger car parts electromagnetic compatibility specification Specification introduction QLQB C-208

Release time:

2022-12-28 00:00

Source:

Introduction
The "QLQB C-208-2014 Electromagnetic Compatibility Specification for Passenger Vehicle Components" was published in 2014. This standard specifies the EMC performance requirements and test specifications of Dongfeng Liuzhou Automobile Co., Ltd. components. The standard is applicable to passenger vehicles.

General requirements
EMC testing of electronic and electrical subsystems/components has been classified according to its use environment, and its EMC test items are different.

Table 1 Product function classification

Type	Description
A	Provide convenience of operation, comfort, entertainment functions, such as radio, air conditioning
B	Features that enhance or assist the driver in driving/controlling the vehicle, but are not necessary for driving/controlling the vehicle, such as anti-lock braking system, fuel indicator
C	Can affect the driver's ability to operate/control the vehicle, can affect other users of the road, and can affect regulated functions such as turn signals, brake lights, and wipers
D	The function of a passive safety system to control explosive devices, such as airbags

Table 2 Functional performance levels after product tests

Level	Description
I	Function and performance are fully in line with the design requirements
II	One or more performance indicators deviate from the design requirements, but all functions are normal. After the interference is removed, the performance index can be automatically restored to the design requirements
III	One or more functions cannot be performed normally. After the interference is removed, the functions can be automatically restored to normal
IV	One or more functions cannot be performed properly. After dry removal, the functions cannot be automatically restored. After simple reset, the functions can be restored
V	One or more functions are not normal. After removing the interference, the functions cannot be restored by simple reset operation and need to be repaired

Table 3 Overall requirements of product immunity

	Class A function	Class B function	Class C function	Class D function
Level 1	I	I	I	I
Level 2	II	I	I	I

Table 4 Types of parts

Type	Description
P	A component or module that contains only passive devices, such as resistors, capacitors, and light-emitting diodes
R	An inductive component or module, such as a relay, solenoid valve, or horn
BM	Brush motor, such as wiper motor, water jet motor
EM	Electronically controlled brushless motor
A	A component or module containing an active device, such as a switching power supply, microprocessor, or operational amplifier
AS	A component or module, usually a sensor, that is powered by a voltage regulator in another module
AX	A component or module that contains an internal perceptual device or controls an external perceptual device
AM	A component or module, such as a hall sensor, that contains an internal magnetic sensor
AW	A separate component or module containing an RF component, such as a tire pressure sensor

Table 5 EMC test options for parts

Test item	Electronic module					Motor
Test item	A	AS	AM	AX	AW	BM	EM	P	R
Launch
Radiation	●	●	●	●		●	●
Power line conduction	●	●	●	●		●	●
Control/signal wire conduction	●	●	●	●			●
Transient conduction				●		●	●		●
Radio frequency disturbance rejection
BCI	●	●	●	●			●
Free field	●	●	●	●	●		●
Low frequency magnetic field			●
Transmitter	○	○	○	○	○		○
Extended audio	○	○	○	○	○		○
Transient disturbance rejection
Power cord	●		●	●			●	●
Control/signal cable	●	●	●	●			●
Electrostatic discharge	●	●	●	●	●		●	●
Note: The symbol "●" indicates that the test is required, and the symbol "○" indicates that the test is optional

Table 6 Receiver parameter Settings

Bandwidth MHz	Peak detection			Quasi-peak detection			Mean detection
Bandwidth MHz	Bandwidth kHz	Step size kHz	Time ms	Bandwidth kHz	Step size kHz	Time ms	Bandwidth kHz	Step size kHz	Time ms
0.15~30	9	5	50	9	5	1000	9	5	50
>30	120	50	5	120	50	1000	120	50	5

表7 抗扰度测试步长与驻留时间

频带	步长
15 Hz~100 Hz	10 Hz
100 Hz~1000 Hz	100 Hz
1 kHz~10 kHz	1 kHz
10 kHz~150 kHz	10 kHz
1 MHz~10 MHz	1 MHz
10 MHz ~200 MHz	5 MHz
200 MHz ~400 MHz	10 MHz
400 MHz ~1000 MHz	20 MHz
1000 M Hz~6000 M Hz	40 MHz
Note: The dwell time of each frequency point is 2s

Figure 1 Test system layout

Note: 1-DUT; 2- Wiring harness; 3- Load simulator; 4- Power supply; 5- Artificial network; 6- test bench; 7- Insulation pad

Figure 2 Remote grounding

Note: 1- Power supply; 2- Artificial network; 3- Load simulator; 4-DUT; 5- Ground plate; 6- Test harness; 7- insulation support; 8-DUT housing ground; 9-50 Ω load

Figure 3 Grounding the terminal

Note: 1- Power supply; 2- Artificial network; 3- Load simulator; 4-DUT; 5- Ground plate; 6- Test harness; 7- insulation support; 8-DUT housing ground; 9-50 Ω load

Test item decomposition
1. Radiation emission

Radiation emission is designed to test the size of electric field radiating to space during the working process of parts, and it is scanned continuously within the frequency range of 0.15MHz ~ 2.5GHz. Radiation emission is formulated by referring to CISPR 25 and GB/T 18655.

Table 8 Antenna and position of radiation emission measurement

Frequency band MHz	Antenna
0.15~30	1 m long vertical monopole antenna (center of harness, vertical)
30~300	Bicone antenna (Center of harness, vertical and horizontal)
200~1000	Log-periodic antenna (center of harness, vertical and horizontal)
1000~2500	Horn or log-periodic antenna (direct to EUT/ harness center, vertical and horizontal)

FIG. 4 Radiation emission arrangement

Table 9 Radiation emission limits

Band	Frequency band MHz	Limit value dBuV/m
Band	Frequency band MHz	Peak value	Quasi-peak	Mean value
Broadcast
LW	0.15~0.3	66	53	46
MW	0.53~1.8	56	43	36
SW	5.9~6.2	52	39	32
FM	76~108	50	37	30
TV I	41~88	40	-	30
TV III	174~230	44	-	34
DAB III	171~245	38	-	28
TV IV/V	468~944	53	-	43
DTTV	470~770	57	-	47
DAB L	1447~1494	40	-	30
SDARS	2320~2345	46	-	36
移动业务
CB	26~28	52	39	32
VHF	30~54	52	39	32
VHF	68~87	47	34	27
VHF	142~175	47	34	27
UHF	380~512	50	37	30
RKE	300~330	44	-	30
RKE	420~450	44	-	30
UHF	820~960	56	43	36
GSM 800	860~895	56	-	36
EGSM/GSM	925~960	56	-	36
GPS L1 1）	1567~1583	-	-	222)
GSM 1800	1803~1882	56	-	36
GSM 1900	1850~1990	56	-	36
3G/IMT 2000	1900~1992	56	-	36
3G/IMT 2000	2010~2025	56	-	36
3G/IMT 2000	2108~2172	56	-	36
Bluetooth	2400~2500	56	-	36
Note 1: GPS frequency band, EMI receiver bandwidth is 9 KHz, step size is 5 KHz. Note 2: For GPS bands, the limit of mean detection is required as defined in Q/LQB C-208 section 5.1.2. Note 3: "-" indicates not applicable.

Table 10 Limits of GPS frequency band

Frequency band MHz	Limit value dBuV/m
1567~1574	62-20664*log(f/1567)
1574~1576	22
1576~1583	22+20782*log(f/1576)

1. Power line conduction emission

The purpose of power conduction emission is to test the interference voltage generated by parts on the power cord during the working process. The power cord conduction emission is formulated by referring to CISPR 25 and GB/T 18655.

Table 11 Limits of conducted emission

Band	Frequency band MHz	Voltage limit dBuV
Band	Frequency band MHz	Peak detector	Quasi-peak detector	Mean detector
Broadcast
LW	0.15~0.3	90	77	70
MW	0.53~1.8	70	57	50
SW	5.9~6.2	65	52	45
FM	76~108	50	37	30
TV I	41~88	46	-	36
Mobile service
CB	26~28	56	43	36
VHF	30~54	56	43	36
VHF	68~87	50	37	30

FIG. 5 Layout of generator test system

Note: 1- battery; 2- Artificial network; 3-DUT; 4- Load simulator; 5- Ground plane; 6- Power cord; 7- Supporting materials; 8- coaxial cable; 9- Measuring equipment; 10- Shielding chamber; 11-50Ω load; 12- Connector; 13- indicator light; 14- Low radiation power source; 15- Rubber belt; 16- load equivalent resistance.

FIG. 6 Layout of ignition system conduction disturbance test system

Note: 1- Power supply; 2- Artificial network; 3- pen ignition coil; 4-ECU simulator; 5- Ground plane; 7- Supporting materials; 8- coaxial cable; 9- Measuring equipment; 10- Shielding chamber; 11-50 Ω load; 12- Connector; 15- photoelectric converter; 16-1000uF capacitor; 17- Engine body simulator; 18- Battery; 19- Signal cable.

Figure 7 Remote grounding test system layout

Note: 1- Power supply; 2- Artificial network; 3-DUT; 4- Load simulator; 5- Ground plane; 6- Power cord; 7- Supporting materials; 8- coaxial cable; 9- Measuring equipment; 10- Shielding chamber; 11-50 Ω load; 12-connector

Figure 8 Layout of the near-end grounding test system

Control/signal line conduction emission
The control/signal line conduction emission is to test the interference current generated by the parts on other wiring harnesses other than the power cord during operation. Reference to CISPR 25 and GB/T 18655 for control/signal line conduction emission.

Table 12 Limits of conducted emission

Band	Frequency band MHz	Voltage limit dBuA
Band	Frequency band MHz	Peak detector	Quasi-peak detector	Mean detector
Broadcast
LW	0.15~0.3	70	57	50
MW	0.53~1.8	42	29	22
SW	5.9~6.2	31	18	11
FM	76~108	16	3	-4
TV I	41~88	12	-	2
Mobile service
CB	26~28	22	9	2
VHF	30~54	22	9	2
VHF	68~87	16	3	-4

FIG. 9 Layout of control/signal line test system

Note: 1- Power supply; 2- Artificial network; 3-DUT; 4- Load simulator; 5- Ground plate; 6- Wiring harness; 7- Insulation pad; 8- coaxial cable; 9- Measuring equipment; 10- Shielding chamber; 12- Connector; 13- Optical fiber; 14- Current probe; 15- Incentive and monitoring system; d- Distance from power probe to DUT, 50 mm

1. Transient conduction emission

The transient conduction emission is to test the magnitude of the impulse voltage across the power line when the component is working. Transient conduction emission is formulated in reference to ISO 7637-2 and GB/T 21437.2

The limit value of positive slow pulse peak is 37V, and the limit value of negative slow pulse peak is -75V.

The limit value of positive fast pulse peak value is 75V, and the limit value of negative fast pulse peak value is -112V.

FIG. 10 Connection diagram of slow pulse test

Figure 11 Fast pulse test connection diagram

1. BCI immunity
  BCI is designed to test the resistance of components to interference currents coupled through wiring harnesses. BCI immunity is formulated in reference to ISO 11452-4. The alternative method was used for testing.
  
  The coupling pliers are arranged 150 mm±10mm away from the DUT connector, and the current pliers are arranged 50 mm±10mm away from the DUT connector
  
  Table 13 BCI test levels

Frequency band

MHz

Level 1

Level 2

Modulation mode

1~400

100

CW 和 AM

Figure 12. BCI (Alternative method) test layout

Note: 1-DUT; 2- Test harness; 3- Load simulator; 4- monitoring system; 5- Power supply; 6- Artificial network; 7- Optical fiber; 8- high frequency equipment (signal generator, power amplifier); 9- Coupling pliers; 10- Earth plate; 11- insulating support material; 12- Shielding room

1. Free field immunity

Free field immunity is to test the ability of components to resist interference electromagnetic waves propagated through space. Free field immunity is formulated in reference to ISO 11452-2. The vertical and horizontal polarization directions were tested.

Table 14 Radiation immunity test grade

Frequency band

MHz

Level 1

V/m

Level 2

V/m

Modulation mode

80~800

100

CW 和 AM

800~2000

100

CW 和 PM

FIG. 13 Layout of radiation immunity test

Note: 1-DUT; 2- Test harness; 3- Load simulator; 4- Power supply; 5- Artificial network; 6- Ground plate; 7- Insulation pad; 8- antenna; 9- Monitoring system; 10- Coaxial cable; 11- Connector; 12- RF signal generators and amplifiers; 13- Absorbing material .If the antenna is a horn antenna, the antenna should face the EUT

1. Low frequency magnetic field immunity

Low frequency magnetic field immunity is to test the ability of parts to resist low frequency magnetic field interference. The low-frequency magnetic field immunity shall be formulated in accordance with ISO 11452-8. The waveform is CW, and the DUT function shall meet the requirements of level I. The distance between the radiation coil and the DUT is d = 50 mm

Before the test, the magnetic field generated by the radiation ring needs to be calibrated

In addition to testing the specified step size, the test must be performed at the frequency points of 16.67 Hz, 50 Hz, 60 Hz, 150 Hz and 180 Hz

The radiant ring is used to generate an interfering magnetic field. It has a diameter of 120 mm and a number of winding turns. AWG 12 wire is used.

The magnetic field probe is a ring sensor with a diameter of 40 mm and a winding number of 51 turns. 7 turns AWG 41 wire with shield. The maximum range of the magnetic field probe should not be less than 1000 A/m

Table 15 Low frequency magnetic field immunity test grade

Frequency band	Intensity (A/m)
15 Hz~1000 Hz	300
1k Hz~10 kHz	300/f 2
10 kHz~150 kHz	3

FIG. 14 Low frequency test immunity layout

Note: 1-DUT; 2- radiation ring; 3- Current clamp; 4- Signal generators and amplifiers; 5- Oscilloscope; 6- Power supply; 7- Battery; 8, 9- Load simulator; 10- insulation pad; 11- Ground plate.

1. Transmitter immunity

Transmitter immunity is designed to test the ability of components to resist electromagnetic waves generated by wireless transmitters. Transmitter immunity is formulated in reference to ISO 11452-9. The DUT shall function to Level I requirements

Table 16 Test grade of handheld transmitter

Transmitter	Frequency band MHz	Power W	Modulation mode
10 m	26~30	10（RMS）	AM，1KHz，80%
2 m	146~174	10（RMS）	CW
70 cm	410~470	10（RMS）	CW
Tetra	380~390,410~420,450~460,806~825,870~876	10（Peak）	PM，18Hz，50%
GSM850	824~849	10（Peak）	PM，217Hz，50%
GSM900	876~915	16（Peak）	PM，217Hz，50%
PDC	893~898,925~958,1429~1453	0.8（Peak）	PM，50Hz，50%
GSM1800/1900	1710~1785,1850~1910	2（Peak）	PM，217Hz，50%
IMT2000	1885~2025	1（Peak）	CW 和 PM，1600Hz，50%
Bluetooth	2400~2500	0.5（Peak）	PM，1600Hz，50%
IEEE802.11	5725~5850	1（Peak）	PM，1600Hz，50%

FIG. 15 Disturbance immunity layout of handheld transmitter

Note: 1-DUT; 2- Test harness; 3- Load simulator; 4- Power supply; 5- Artificial network; 6- Ground plate; 7- Insulating materials; 8- Portable transmitter; 9- Monitoring equipment; 10-50 Ω coaxial cable; 11- Connector; 12- RF signal generator, amplifier, coupler, power meter; 13- Absorbing material; 15- insulation pad; 16- Coaxial cable.

1. Extended audio machine immunity

Extended audio immunity is designed to test the ability of parts to resist audio interference. Extended audio immunity is formulated in reference to ISO 11452-10.

The strength of the injected interference signal should be gradually increased until the required strength is reached. In the process of gradual increase, if the DUT appears abnormal, the increase of interference intensity should be stopped. Monitor the coupling incoming current intensity to ensure that the RMS value of the coupling current intensity does not exceed 1 A.

Table 17 Audio immunity test level

Intensity class

Interference peak value

Level 1

Level 2

Figure 16 audio immunity test layout

Note: 1- audio signal generator; 2- Test wire; 3- Power and load simulator; 4- ground wire; 5- capacitance; 6- Voltage measuring equipment; 7- Current probe; 8-DUT; 9- Current measuring equipment; 10- Power amplifier; 11- Isolation transformer.

1. Power line transient conduction immunity

Power line transient conduction immunity is designed to test the component's ability to resist interference voltage pulses on the power line. Power line transient conduction immunity Refer to ISO 7637-2 and GB/T 21437.2 to establish a parallel resistance to simulate the impedance of other electrical devices of the vehicle in parallel with the DUT. Generally, a resistance of 40 Ω is selected. In order to simulate more severe conditions, the parallel resistance 7 can not be connected during the test

Table 18 transient immunity function levels

Test pulse	Functional type				Grade	Strength
Test pulse	Class A	Class B	Class C	Class D	Grade	Strength
Pulse 1	Ⅲ	Ⅲ	Ⅲ	Ⅰ	-112V	500 pulse
Pulse 2a	Ⅰ	Ⅰ	Ⅰ	Ⅰ	55V	500 pulse
Pulse 2b	Ⅲ	Ⅲ	Ⅲ	Ⅰ	10V	10 pulse
Pulse 3a	Ⅰ	Ⅰ	Ⅰ	Ⅰ	-165V	1 h
Pulse 3b	Ⅰ	Ⅰ	Ⅰ	Ⅰ	112V	1 h
Pulse R	Ⅲ	Ⅲ	Ⅲ	-	See the picture below	2 sets, 60 s apart
Pulse A	Ⅲ	Ⅲ	Ⅲ	-	See the picture below	3 sets, 60 s apart
Pulse B	Ⅲ	Ⅲ	Ⅲ	-	See the picture below
Pulse C	Ⅰ	Ⅰ	Ⅰ	-	See the picture below
Pulse P	Ⅲ	Ⅲ	Ⅲ	-	See the picture below	2 sets, 60 s apart
Note: The symbol "-" in the table indicates that it is not applicable.

Note:

1. The power pin is powered by the battery, and the Up of pulse A is 13.5V. For power pins powered by other regulator modules, the Up of pulse A is the voltage output by the regulator module, such as 5 V.

The values of 2 and T are 100 us, 300 us, 500 us, 2 ms, 5 ms, 10 ms, 30 ms and 50 ms respectively.

Figure 19 Waveform of pulse B

Note:

The values of 2 and T are 100 us, 300 us, 500 us, 2 ms, 5 ms, 10 ms, 30 ms and 50 ms respectively.

Figure 20 Pulse C waveform

Note:

2. The values of T are 100 us, 300 us and 500 us respectively.

FIG. 21 Pulse P waveform

注：

Waveform parameter	Value	Waveform parameter	Value
T1	100 ms	T8	11 s
T2	5 ms	T9	325 ms
T3	185 ms	U1	5 V
T4	15 ms	U2	9 V
T5	50 ms	U3	12.5 V
T6	10 s	U4	13.5 V
T7	500 ms	U5	Peak-to-peak value is 2 V and frequency is 4 Hz

Figure 22 Power transient immunity arrangement

Note: 1- Oscilloscope; 2- voltage probe; 3- Test pulse generator; 4-DUT; 5- Ground plane; 6- ground wire; 7- Parallel resistance

1. Control/signal line transient conduction immunity

Control/signal line transient conduction immunity is designed to test the component's ability to resist electromagnetic interference from control/signal line coupling other than the power line. Reference ISO 7637-3 and GB/T 21437.3 for control/signal line transient conduction immunity

Fast pulse, CCC method was used for testing, waveform reference 3a and 3b;

Slow pulse, test by ICC method, waveform reference 2a;

Figure 23 CCC test layout

Figure 24 ICC test layout

1. Electrostatic discharge (ESD01)

Electrostatic discharge shall be tested according to the method defined in ISO 10605:2008. For specifications and placement of HCPS and VCPS, refer to IEC 61000-4-2:2008.

When testing, it should be tested grade by grade, from low voltage to high voltage, according to the discharge intensity shown in the table below.

Each measurement point and each test voltage shall be measured no less than 3 times. The time interval between the two tests should be no less than 1 s.

During the test, the Angle between the discharge gun and the surface of the measuring point should not be less than 45º. If conditions permit, the discharge gun should be perpendicular to the surface of the measuring point.

When the discharge position of DUT is a conductor, the contact discharge mode is adopted. For non-conductor, air discharge is used.

Note: In non-working mode, discharge module 150pF/330Ω; In working mode, the discharge module in the car is 330pF/2000Ω; External discharge module 150pF/2000Ω;

Table 19 Discharge intensity

Intensity class	Contact discharge	Air discharge
L1	±4 kV	±6 kV
L2	±6 kV	±8 kV
L3	±8 kV	±15 kV
L4	Not applicable	±25 kV

Table 20 Function and performance requirements

Intensity class	Class A function	Class B function	Class C function	Class D function
L1	Ⅰ	Ⅰ	Ⅰ	Ⅰ
L2	Ⅰ	Ⅰ	Ⅰ	Ⅰ
L3	Ⅲ	Ⅲ	Ⅱ	Ⅰ
L4	Ⅲ	Ⅲ	Ⅱ	Ⅰ

Figure 25 ESD layout in working mode

Note: 1-DUT; 2-ESD gun; 3-ESD generator; 4- Test table; 5- Ground plate; 6- Ground point; 7- ground wire; 8-DUT remote module; 9- Load simulator; 10- battery; 11, 12- insulation pad; 13-470Ω resistance; 14- Ground plane (optional); 15- The ground point on the grounding plate

Figure 26 ESD layout in non-working mode

Note: 1-DUT; 2-ESD gun; 3-ESD generator; 4- Test table; 5- horizontal coupling plane; 6- Ground point; 7- ground wire; 8- Insulating material.

Century Wisdom (Suzhou) Testing Technology Co., Ltd

www.300.cn nanjing SEO

Business License

全部

全部
产品管理
新闻资讯
介绍内容
企业网点
常见问题
企业视频
企业图册