Introduction to Electromagnetic Compatibility Test Specifications for Ideal Automotive Electronic and Electrical Parts and Systems QLiA3800006-2021 (V2)_Century Wisdom (Suzhou) Testing Technology Co., Ltd

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Introduction to Electromagnetic Compatibility Test Specifications for Ideal Automotive Electronic and Electrical Parts and Systems QLiA3800006-2021 (V2)

Release time:

2022-12-30 00:00

Source:

"QLiA3800006-2021 (V2) Electromagnetic Compatibility Test Specifications for Automotive Electronic and Electrical Parts and Systems" was released in 2021. This standard specifies the electromagnetic compatibility (EMC) requirements and test methods for automotive electronic and electrical parts and systems developed and produced by Ideal Auto.

General requirements

The EMC test of electronic and electrical subsystems/components has been classified according to its use environment, and its EMC test items are also different.

Table 1 Matrix Diagram of Testing Requirements for Low-Voltage Electronic/Electrical Components

Chapter number

Type of parts

Test items

Parts classification

passive components

Sensitive parts

Motor

active electronic components

EMF

interference test

7.1.1

Radiated Emissions (RE)

√f

√

7.1.2

Components, Modules Conducted Emissions (CE)

√f

√

7.1.3

Conducted Transient Emissions (CTE)

√

7.1.4

Harmonic emission

7.1.5

Emission of voltage variations, fluctuations and flicker

7.1.6

AC Mains RF Conducted Emissions

7.1.7

Magnetic field emission (near field) a

√

7.1.8

Parts human electromagnetic exposure test (EMF)b

√

7.1.9

Shielding Effectiveness/Transfer Impedance Testc

√

Anti-interference test

7.2.1

Bulk Current Injection (BCI)

√

7.2.2

Anechoic chamber method (RI)

√

7.2.3

Magnetic Field Immunity (MFI)

√

7.2.4

Portable Transmitter Immunity (PT)d

√

Transient immunity test

7.3.1

Coupling Immunity (CIS)

√

7.3.2

Transient Conducted Immunity (CIP)e

√

7.3.3

Electrostatic Discharge (ESD)

Power-on

√

Not powered on

√

indirect discharge

√

7.3.4

Surge Immunity

7.3.5

Electrical Fast Burst Immunity

P: A part consisting only of passive components. Such as: capacitors, diodes, switches with LED backlight, etc.

R: relay, solenoid valve/pump, horn, etc.

BM: Motor Motor: A motor without a control module on the motor body.

EM: Motor body with electronics control module.

A: Parts including active electronic components, such as: analog amplifier circuits, switching power supplies, microprocessor-based controllers and displays.

AS: A part or module that is powered by another module, usually a sensor that provides a signal to the controller.

AM: A part or module that itself contains a magnetically sensitive element or is connected to an external magnetically sensitive element.

AW: Modules without external wires, such as remote keys, tire pressure sensors.

AX: Contains an electrical or electronically controlled magnetic relay itself, or controls an external inductive device (such as an electronically or electrically controlled motor)

a: This test is required for motors and other components with an operating current greater than 1A. The test distance for components in the engine room is 30cm, and the test distance for components in the passenger compartment

7cm away.

b: This test item is only applicable to electronic and electrical devices and systems in the passenger compartment.

c: This test is applicable to low-voltage shielded wire harness and its connectors.

d: This test item is applicable to electronic appliances and components in the passenger compartment.

e: This type of test is only applicable to products that are directly connected to the battery (including direct connection or connection through a switch).

f: For short-time working motors, the working time is less than 1s, and radiation emission and conduction emission may not be carried out.

Table 2 Matrix diagram of testing requirements for high-voltage electronic/electrical components

Chapter number	Type of parts Test items	Parts classification
Chapter number	Type of parts Test items	Electric motor control	DCDC	car charger	car with home charging pile	Other high voltage electrical devices
interference test
7.1.1	Radiated Emissions (RE)	√	√	√	√	√
7.1.2	Components, Modules Conducted Emissions (CE)	√	√	√	√	√
7.1.3	Conducted Transient Emissions (CTE)a	√	√	√	√	√
7.1.4	Harmonic emission			√	√
7.1.5	Emission of voltage variations, fluctuations and flicker			√	√
7.1.6	AC Mains RF Conducted Emissions			√	√
7.1.7	Magnetic field emission (near field)b	√	√	√		√
7.1.8	Parts human electromagnetic exposure test (EMF)				√
7.1.9	Shielding Effectiveness/Transfer Impedance Test C	√	√	√	√	√
	Anti-interference test
7.2.1	Bulk Current Injection (BCI)	√	√	√		√
7.2.2	Anechoic chamber method (RI)	√	√	√	√	√
7.2.3	Magnetic Field Immunity (MFI)
7.2.4	Portable Transmitter Immunity (PT)
	Transient test
7.3.1	Coupling Immunity (CIS)	√	√	√	√	√
7.3.2	Transient Conduction Immunity (CIP)	√	√	√	√	√
7.3.3	Electrostatic Discharge (ESD)	√	√	√	√	√
7.3.4	Surge Immunity			√	√
7.3.5	Electrical Fast Burst Immunity			√	√
a: The low-voltage interface of high-voltage electrical devices is suitable for this project. b: High-voltage electrical devices and their low-voltage wiring harnesses (current greater than 1A) are suitable for this project. c: High voltage shielded wire harness and its connectors are suitable for this project.

Classification of performance:

Class A: All functions of the tested sample or system operate normally during and after the disturbance, meeting the design requirements;

Class B: All functions of the sample or system under test operate normally when disturbed. However, the operation of one or more functions will deviate from the specified tolerance. All functions can automatically return to normal after the interference is removed, but the memory function cannot be affected;

Class C: One or more functions of the tested sample or system cannot operate normally when disturbed, but can automatically return to normal conditions after the disturbance is removed, but the memory function cannot be affected;

Class D: When and after being disturbed, the functions of the equipment and system cannot operate normally, but after the disturbance is removed and reset by the operator/user, it can still operate normally, but the memory function cannot be affected;

Class E: Equipment and systems do not function normally during and after the disturbance and cannot be restored to normal condition without repair or replacement of the equipment or system.

illustrate:

1——Power supply 4——Insulation bracket (ε≤1.4)

2——artificial network 5——the sample DUT under test

3——Metal load box (optional, need to be well grounded) 6——Ground plane

3a——The load of the sample under test (reference power supply) DUT 7——Optical fiber

3b——The load of the sample under test (refer to the test load box shell) DUT 8——Optical fiber interface

3c——Optical fiber interface (optional, can be set outside the test load box) 9——Auxiliary/monitoring equipment

Figure 1 Test layout

Decomposition of test items
1. radiation emission

This test item is suitable for high/low voltage parts and systems, and the high voltage system must work normally during the test. Radiated emission is formulated with reference to CISPR 25 and GB/T 18655. The radiated emission test results shall meet the continuous limit value and segmental limit value required in Table 3 and Table 4.

Test Antenna:

0.15MHz～30MHz electric field test 1m monopole vertical antenna; magnetic field test 60cm diameter electrostatic shielding loop antenna.
30MHz～200MHz biconical antenna;
200MHz～1000MHz logarithmic periodic antenna;
1000MHz～5000MHz horn antenna or logarithmic periodic antenna.

Table 3 Continuous Limit Requirements

frequency band	Frequency range (MHz)	Limit A Peak PK dB (μV/m)	Limit B Peak PK dB (μA/m)	Limit C QP dB (μV/m)	Limit D Average AV dB (μV/m)
M1	0.15～4.77	88.89-20lg(f)	37.36-20 lg (f)	——	——
M2	4.77～15.92	116.05-60 lg (f)	64.52-60 lg (f)	——	——
M3	15.92～20	67.98-20 lg (f)	16.45-20 lg (f)	——	——
M4	20～30	41.96	-9.57	——	——
M5	30～75	——	——	56～46 56-25.13*Log(f /30)	46～36 46-25.13*Log (f/30)
M6	75～400	——	——	46～57 46+15.13*Log(f /75)	36～47 36+15.13*Log (f/75)
M7	400～1000	——	——	57	47
a: f is the measurement frequency (MHz). b: The whole frequency band needs to comply with limit value A, limit value B, limit value C and limit value D at the same time. c: 9kHz bandwidth detector (0.15MHz ~ 30MHz), 120kHz bandwidth detector (30MHz ~ 1000MHz). d: The test distance is 1m. e: Limits A and B test equipment should meet the relevant requirements in GB/T 18387-2017, and limit B is only for the drive motor and motor controller system.

Table 4 Subsection limits for radiated emissions of parts

Frequency (MHz)	Limit requirement dB (μV/m)
Frequency (MHz)	the peak	quasi-peak	average value
0.1～0.15	66	——	——
0.15～0.3	66	53	46
0.52～1.8	56	53	36
76～108	44	43	twenty four
171～245	38	31	28
300～330	44	——	30
420～450	38	——	twenty four
820～960	56	43	36
1447～1494	40	——	30
1553～1567	——	——	11.5
1567～1583	——	——	16
1591～1617	——	——	16
1710～2690	56	——	36
3300～3800	56	——	36
4800～5000	56	——	36
6000～8500	56	——	36
a: 0.1 MHz to 3 000 MHz full-band scan, when the peak value exceeds the quasi-peak limit value, perform quasi-peak scan in the over-standard frequency band, which must meet the limit requirements of PK, QP and AV at the same time. b: For short-term disturbance sources (such as rearview mirror adjustment motors), the peak limit can be increased by 6 dB with the agreement of the ideal automotive engineering department. c: For ignition coil parts, only the continuous limit value requirements need to be met if the EMC performance of the whole vehicle meets the requirements and the consent of the ideal automobile engineering department is obtained.

Figure 2 Radiated emission limits of components (limit A, limit C, limit D)

Figure 3 Radiated Emission Limits of Components (Limit B)

1. Power Line Conducted Emissions
  1. Conducted Emission-Voltage (CEV)

This test item is applicable to high/low voltage parts and system high pressure port and low pressure port, and the high voltage needs to work normally during the test, which should meet the corresponding requirements of GB/T 18655-2018.

The low-voltage port voltage limit for conducted emission shall comply with the requirements in Table 5.

The voltage limit of the high-voltage port for conducted emission shall meet the requirements in Table 6.

Table 5 Conducted emission limits - voltage method (low voltage wiring harness)

Frequency (MHz)	Limit requirement dB (μV)
Frequency (MHz)	the peak	quasi-peak	Average AVG
0.1～0.15	90	——	——
0.15～0.3	90	77	70
0.53～1.8	70	57	50
5.9～6.2	65	52	45
30～54	56	43	36
68～108	50	37	30
a: 0.1MHz-108 MHz full-band scan, when the peak value exceeds the quasi-peak limit, the quasi-peak scan will be performed in the over-standard frequency band, and the PK, QP and AV limit requirements must be met at the same time. b: For short-term disturbance sources (such as rearview mirror adjustment motors), the peak limit can be increased by 6 dB with the agreement of the ideal automotive engineering department.

Figure 4 Low voltage transfer to emission limit - voltage method

Table 6 Conducted Emission Limits - Voltage Method (High Voltage Harness)

Frequency (MHz)	Limit requirement (dBμV)
Frequency (MHz)	the peak	quasi-peak	average value
0.15～0.3	127	114	107
0.53～1.8	100	87	80
5.9～6.2	89	76	69
30～54	71	58	51
68～108	62	49	42
a: 0.15 MHz to 108 MHz full-band scan, when the peak value exceeds the quasi-peak limit, the quasi-peak scan is performed in the exceeding-standard frequency band, and the PK, QP, and AV limit requirements must be met at the same time. b: For short-term disturbance sources (such as rearview mirror adjustment motors), the peak limit can be increased by 6 dB with the agreement of the ideal automotive engineering department.

Figure 5 High voltage transmission to the emission limit - voltage method

1. 1. Conducted Emission-Current Method (CEC)

This test item is applicable to high/low voltage parts or systems. The single wire and wire pair of the high voltage wiring harness and the low voltage wiring harness need to be tested, which should meet the corresponding requirements of GB/T 18655-2018.

All signal and control lines shall be tested.

The current limits for conducted emissions shall comply with the requirements in Table 7.

Table 7 Conducted emission limits - current method

Frequency (MHz)	Limit requirement dB(μA)
Frequency (MHz)	the peak	Quasi-Peak Quasi-Peak	Average AVG
0.1～0.15	70	——	——
0.15～0.3	70	57	50
0.53～1.8	42	29	twenty two
5.9～6.2	31	18	11
30～54	twenty two	9	2
68～108	16	3	-4
171～245	10	——	0
a: 0.1 MHz to 108 MHz full-band scan, when the peak value exceeds the quasi-peak limit, the quasi-peak scan is performed in the exceeding-standard frequency band, and the PK, QP and AV limit requirements must be met at the same time. b: For short-term disturbance sources (such as rearview mirror adjustment motors), the peak limit can be increased by 6dB with the consent of the ideal automotive engineering department.

Figure 6 Conducted emission limits - current method

1. Conducted Transient Emissions (CTE)

This test item does not apply to high-voltage parts/system high-voltage ports, but high-voltage parts/system low-voltage ports still need to be tested, and the high voltage needs to be powered on during the test.

Comply with the relevant requirements in ISO 7637-1:2015 and ISO 7637-2:2011.

See Figure 7 for the test setup.

During the fast pulse test, the positive transient voltage of the tested sample should not exceed +50V, and the negative transient voltage should not exceed -75V. During the slow pulse test, the positive transient voltage of the tested sample should not exceed +25V, and the negative transient voltage should not exceed The state voltage should not exceed -50V, where the limit is the test value relative to 0V.

Figure 7 Transient conducted emission test layout

Note: All dimensions are in mm

illustrate:

1——digital oscilloscope 5——ground plane

2——voltage probe 6——battery

3——Artificial network (AN), mechanical/electronic switch 7——Earth wire, length <100mm

4——The sample DUT under test

1. Harmonic emission

This test item is only applicable to the measurement of AC power lines of on-board chargers or off-vehicle chargers, and shall specifically meet the corresponding requirements of IEC 61000-3-2/ IEC 61000-3-12.

The limit value of I≤16A is required to meet the Class A equipment specified in IEC 61000-3-2 (version 3.2 in 2005 and amendment 1 in 2008 and amendment 2 in 2009). See Table 8 for details

The limit value of I＞16A and ≤75A should meet the requirements of IEC 61000-3-12 (version 1.0 in 2004). See Tables 9, 10, and 11 for details.

Table 8 I≤16A measurement limit

Harmonic number n	Maximum allowable harmonic current A
odd harmonic
3	2.3
5	1.14
7	0.77
9	0.40
11	0.33
13	0.21
15≤n≤39	0.15 *15/n
even harmonic
2	1.08
4	0.43
6	0.30
2≤n≤40	0.23*8/n

Table 9 Current emission limits other than three-phase balanced equipment with I>16A and ≤75A

Minimum Rsce	Acceptable single harmonic current Ih/Iref a %						Acceptable harmonic current distortion %
Minimum Rsce	I3	I5	I7	I9	I11	I13	THC/ Iref	PWHC/ Iref
33	21.6	10.7	7.2	3.8	3.1	2	twenty three	twenty three
66	twenty four	13	8	5	4	3	26	26
120	27	15	10	6	5	4	30	30
250	35	20	13	9	8	6	40	40
≥350	41	twenty four	15	12	10	8	47	47
Note 1: The current value of the 12th and following even-order harmonics should not exceed (16/n)%. The even and odd harmonics above the 12th order are also considered with THC and PWHC. Note 2: Linear interpolation between two consecutive Rsce is allowed.
a: Iref is the fundamental wave reference current value In is the harmonic current component.

Table 10 Current emission limits for three-phase balanced equipment with I>16A and ≤75A

Minimum Rsce	Acceptable single harmonic current Ih/Iref a %				Acceptable harmonic current distortion %
Minimum Rsce	I5	I7	I11	I13	THC/ Iref	PWHC/ Iref
33	10.7	7.2	3.1	2	13	twenty two
66	14	9	5	3	16	25
120	19	12	7	4	twenty two	28
250	31	20	12	7	37	38
≥350	40	25	15	10	48	46
Note 1: The current value of the 12th and following even-order harmonics should not exceed (16/n)%. The even and odd harmonics above the 12th order are also considered with THC and PWHC. Note 2: Linear interpolation between two consecutive Rsce is allowed.
a: Iref is the fundamental wave reference current value In is the harmonic current component.

Table 11 Current emission limits of three-phase balanced equipment under specified conditions of I>16A and ≤75A

Minimum Rsce	Acceptable single harmonic current Ih/Iref a %				Acceptable harmonic current distortion %
Minimum Rsce	I5	I7	I11	I13	THC/ Iref	PWHC/ Iref
33	10.7	7.2	3.1	2	13	twenty two
≥120	40	25	15	10	48	46
Note 1: The current value of the 12th and following even-order harmonics should not exceed (16/n)%. The even and odd harmonics above the 12th order are also considered with THC and PWHC. Note 2: Linear interpolation between two consecutive Rsce is allowed.
a: Iref is the fundamental wave reference current value In is the harmonic current component.

1. Emission of voltage variations, fluctuations and flicker

This test item is only applicable to the measurement of the AC power line of the on-board charger or off-vehicle charger, and it shall meet the corresponding requirements of IEC 61000-3-3;2008/IEC 61000-3-11;2000.

I≤16A limit value requirements meet IEC 61000-3-3;2008. See Table 12 for details

The limit value of I>16A and ≤75A should meet the requirements of IEC 61000-3-11;2000. See Table 12 for details

Table 12 Measurement limits

Device input current	Limit requirements
I≤16A	According to the requirements of Chapter 5 of IEC 61000-3-3;2008
16<1<75	According to the requirements of Chapter 5 of IEC 61000-3-11;2000

1. AC Mains RF Conducted Emissions

This test item is only applicable to the measurement of AC power lines of on-board chargers or off-board chargers, and it shall meet the corresponding requirements of IEC 61000-6-3;2006.

The test limits should meet the requirements in the table below. See Tables 13 and 14 for details.

Table 13 AC charging measurement limits

Frequency (MHz)	Limits and detectors
0.15～0.5	66～56dBμV (QP) 56～46μV (AV) Decreases with frequency as a logarithmic function
0.5～5	56dBμV (QP) 46dBμV (AV)
5～30	60dBμV (QP) 50dBμV (AV)

Figure 8 AC charging measurement limits

Table 16 DC charging measurement limits

Frequency (MHz)

Limits and detectors

0.15～0.5

79dBμV (QP)

66dBμV (AV)

0.5～30

73dBμV (QP)

60dBμV (AV)

Figure 9 DC charging measurement limits

1. Magnetic field emission (near field)

This test item is applicable to the high/low voltage parts system, and the high voltage system needs to be powered on during the test. Motors and other components with operating current greater than 1A need to carry out this test.

The layout of the magnetic field emission test is shown in Figure 10

The limits of magnetic field emissions shall comply with the requirements in Table 17. Limit requirements are shown in Figure 11.

Figure 10 Layout of magnetic field emission test

Table 17 Magnetic Field Emission Limits

Frequency (kHz)	Limit requirement dBpT
0.02~1	162
1~100	162-30lgFreq (kHz)
100~200	95

Figure 11 Magnetic field emission limits

1. Parts human electromagnetic exposure test (EMF)

This test item is applicable to the high/low voltage parts system, and the high voltage system needs to be powered on during the test. This test item is only applicable to electronic and electrical devices and systems in the passenger compartment.

The limit value of magnetic field emission should meet the emission limit requirements of 10Hz-400kHz in GB 8702-2014, see Table 18 for details, and see Figure 12 for limit value requirements.

The parameter setting of the measuring probe should meet the requirements in Table 19. The test arrangement should meet the requirements in Figure 13.

Table 18 Limits

Frequency range (kHz)	Magnetic induction (uT)
10Hz～25Hz	5000/f
0.025kHz～1.2kHz	5/f
1.2kHz～2.9kHz	4.1
2.9kHz～57kHz	12/f
57kHz～100kHz	12/f
100kHz～400kHz	0.12
Note: The unit of frequency f is the unit of the first column in the row.

Figure 12 EMF limits

Table 19 ELT-400 Default Settings

Detector	standard
Frequency offline:	10Hz
scope	Low (default setting - switch to High if measurements exceed the 8702's 100% limit.
Maximum hold:	close

Figure 13 Test layout

illustrate:

1——DUT 7——Low-voltage power supply

2——Reference Plate 8——Low Voltage Load Simulator

3——100mm insulating support plate 9——Measuring probe

4——High voltage artificial network HV in the shielded shell 10——High voltage wiring harness (HV+, HV-)

5——High voltage power supply 11——Low voltage power line/signal line LV

6——Low-voltage artificial network LV

Figure 14 Test location map

Figure 15 Separation distance

1. Shielding Effectiveness/Transfer Impedance Test

This project is applicable to the shielding effectiveness and transfer impedance test of high/low voltage shielded cables. The triaxial method is preferred for testing.

Shielding effectiveness is required to be ≥40dB within the frequency range of 150kHz to 108MHz. Meet GBT37130-2018 standard requirements.

See Table 20 for the transfer impedance requirements of the shielded wire harness and the surface of the connector. The transfer impedance test method shall comply with the requirements in 5.6 of IEC 62153-4-3.

Table 20 Transfer Impedance Limits

Test object	9kHz～2MHz	2MHz～30MHz
Shielded cable	≤10mΩ/m	≤40mΩ/m
shielded connector	≤10mΩ	≤50mΩ
Shielded cable connector assembly	≤20mΩ/m	≤100Ω/m

1. Bulk Current Injection (BCI)

This test item does not apply to high-voltage parts/system high-voltage wiring harnesses, but high-voltage parts/system low-voltage wiring harnesses still need to be tested, and the high voltage needs to be powered on during the test, which should meet the corresponding requirements of ISO 11452-4:2020.

Only when the injected current value of the sample under test is greater than the requirements in Table 21 and Figure 16, the phenomenon that the function deviates from the design requirements is allowed.

If the free field immunity test of the whole vehicle fails below 200MHz, and the BCI test of the parts fails to reproduce the fault, the retest and troubleshooting can be carried out according to the strip line method of the parts, referring to ISO11452-5 for details.

Table 21 High current injection method anti-interference test requirements

Frequency (MHz)	Level 1 (dBuA)	Level 2 (dBuA)	method	Modulation
0.1～1	64	70	DBCIb	CW, AM80%
1～15	64～100 64+30.61*log(f)	70～106 70+30.61*log(f)		CW, AM80%
15～30	100	106		CW, AM80%
30～400	100～90 100- 8.89*log (f/30)	106～96 106-8.89*log (f/30)	CBCI	CW, AM80%
	Function status Function status		All wiring harnesses of the sample under test shall be placed in the injection clamp.
Region I	A	——
Region IIa	A	C
Region III	——	A

a: Both Level 1 and Level 2 of Region II functional levels need to meet the requirements. It is recommended to implement the higher level requirements first. If the higher level meets the requirements of Class A, the lower level requirements do not need to be implemented.

b: If the wiring of the DUT is all power lines, the grounding wire should be arranged outside the large current injection probe (DBCI). If the DUT is a sensor that uses a dedicated power supply to return to another module, then all related The wiring should be routed inside the high current injection probe.

Figure 16 High current injection method anti-interference test requirements

1. Anechoic chamber method (RI)

High/low voltage components and systems are suitable for this test item, and the high voltage system needs to be powered on during the test.

Only when the field strength value of the tested sample is greater than the requirements in Table 22, the phenomenon that the function deviates from the design requirements is allowed.

Comply with the relevant requirements in ISO 11452-1:2015 and ISO 11452-2:2019.

Refer to Chapter 7 of 1SO 11452-2:2019 for the layout of low-voltage unshielded power cables.

See Chapter 8 of 1SO 11452-2 2019 for details on the layout of high-voltage shielded power cables.

Table 22 Free field anti-radio frequency interference test requirements

Frequency (MHz)	Level 1 (V/m)	Level 2 (V/m)	Modulation
80～200a	50	100	CW, AM80%
200～800a	50	100	CW, AM80%
800～2000	50	70	CW PM1, ton = 577 µs, T = 4.6 ms
1 200～1 400	——	300	Radar pulse b packets PRR=300 Hz, PD=3 μs（+3/-0 μs ）,with only 50 pulses output every 1 sc
2 700～3 100	——	300
	functional status		——
Region I	A	——
Region II d	A	C
Region III	——	A
a: Among them, 200 MHz to 400 MHz only need antenna vertical polarization, and other frequency bands need antenna vertical polarization and horizontal polarization. b: Pulse field strength is the maximum effective value (V/m). c: Unless otherwise specified in the test plan, the radar pulse test is not required, and the ground plane is laid on the table during the test. d: Both Level 1 and Level 2 of Region II function levels need to meet the requirements. It is recommended to implement the requirements of the higher level first. If the higher level meets the requirements of Class A requirements, low-level requirements may not be implemented.

1. Magnetic Field Immunity (MFI)

This test item is suitable for high/low voltage parts/systems, and the high voltage system needs to be powered on during the test. Comply with the relevant requirements in ISO 11452-1:2015 and ISO 11452-8:2015. The test setup is shown in Figure 17.

Only when the test level exceeds the requirements in Table 23, the function of the tested sample is allowed to deviate from the design requirements.

Table 23 Magnetic field immunity test requirements

Frequency band (Hz)	Test level 1 (A/m)	Test level 2 (A/m)
DC, 16.67 Hz, 50 Hz, 60 Hz	300	1 000
15～1000	300	1 000
1000～10000	300/(ƒ/1 000)2	1 000/( ƒ/1 000)2
10000～150000	3	10
	functional status
Region I	A	——
Region IIa	A	C
Region III	——	A
a: Both Level 1 and Level 2 of Region II functional levels need to meet the requirements. It is recommended to implement the higher level requirements first. If the higher level meets the requirements of Class A, the lower level requirements do not need to be implemented.

Figure 17 Radiation coil method test layout

illustrate:

1——The sample DUT under test	7—Battery
2—radiating coil	8 - sensor
3——Current Probe	9——Executive agency
4 - Signal Source and Amplifier	10 - insulating pad
5 - Oscilloscope	11 - ground plane
6 - power supply

1. Handheld Transmitter Immunity (PT)

It is suitable for high/low voltage components and systems installed in the passenger compartment or luggage compartment, and the relative positions of the hand-held transmitter and components meet the requirements defined in Table 28. Comply with the relevant requirements in ISO 11452-1:2015 and ISO11452-9:2012. The layout of the low-voltage system test sample is shown in Figure 18. The sample layout of the high-voltage system shall be carried out in accordance with the GB/T 18655-2018 standard. The anti-interference performance of the hand-held transmitter of the components should not be lower than the requirements in Table 24.

Table 24 Handheld Transmitter Anti-jamming Test Requirements

Frequency band (Hz)	Modulation	Test Level 1 (w)	Test Level 2(w)
360MHz～480MHz	PM, 18Hz, 50%	4.5	9
800MHz～1000MHz	PM, 217Hz, 12.5%	7.0	14
1600MHz～1950MHz	PM, 217Hz, 12.5%	1.5	3
1950MHz～2200MHz	PM, 217Hz, 12.5%	0.75	1.5
2400MHz～2500MHz	PM, 1600Hz, 50%	0.1	0.2
2500MHz～2700MHz	PM, 217Hz, 12.5%	0.25	0.5
		functional status
Region I		A	——
Region IIa		A	B
Region III		B	A
a: Both Level 1 and Level 2 of Region II functional levels need to meet the requirements. It is recommended to implement the higher level requirements first. If the higher level meets the requirements of Class A, the lower level requirements do not need to be implemented.

Figure 18 Handheld transmitter test layout

1 - RF generator equipment	7——LV analog load
2——High quality double shielded coaxial cable	8 - Artificial Network
3——measurement antenna/50mm	9 - battery
4 - DUT	10 - Supported Devices
5——insulation support	11 - ground plane
6——Test Harness

Table 25 Handheld transmitter test distance and antenna position

DUT description

Antenna to DUT distance h

Antenna position stepping

The first 300mm of the DUT and its wiring harness (measured from the connector) may be intentionally or unintentionally placed 50mm to 200mm from a handheld wireless transmitter.

50mm

100mm

Key fobs and similar devices that may come into direct contact with hand-held portable transmitters, and all other surfaces and their wiring harnesses within the first 300mm of them may be installed at a distance from insufficient storage space

50mm place DUT.

5mm

30mm

1. Coupling Immunity (CIS)

This test item does not apply to high-voltage parts/system high-voltage ports and wiring harnesses, but high-voltage parts/system low-voltage ports and wiring harnesses still need to be tested, and the high voltage needs to be powered on during the test, which should meet the corresponding requirements of ISO 7637-3:2016.

There are three types of tests: capacitive coupling clamp (CCC), direct capacitive coupling (DCC) and inductive coupling clamp (ICC), among which direct capacitive coupling (DCC) and inductive coupling clamp (ICC) are only applicable to sensor devices , you can choose one of the two methods.

Comply with the relevant requirements in ISO 7637-1:2015 and ISO 7637-3:2016.

Test with each pulse in Table 26, and the function of the tested sample should meet the design requirements of Class A.

Figures 19 to 21 are layout diagrams of the three methods.

Table 26 Coupling Anti-interference Test Requirements

test pulse	Test Level 3	Minimum test time	Test Methods	Pulse period
test pulse	Test Level 3	Minimum test time	Test Methods	Min.	Max.
3a	-60V	1 hour	CCC	90ms	110ms
3b	+40V	1 hour	CCC	90ms	110ms
2-Positive1	+30V	5 minutes	DCC2	0.5 s	5 seconds
2-Negative1	-30V	5 minutes	DCC2	0.5 s	5 seconds
2-Positive1	+6V	5 minutes	ICC	0.5 s	5 seconds
2-Negative1	-6V	5 minutes	ICC	0.5 s	5 seconds
Note 1: Pulse 2-positive and negative is only applicable to sensor components. Note 2: The DCC coupling capacitor parameter is 0.1 μF, and the CAN line coupling capacitor parameter is two 470 pF connected to CAN H and CAN L respectively. DCC Note 3: For CCC and DCC, the test level Us is the open circuit voltage of the pulse generator; for ICC, the test level Us is the output voltage measured by the calibration test arrangement.

Figure 19 Capacitive coupling clamp method test layout - CCC method

1 - insulating pad	7—Battery
2——The sample DUT under test	8 - Oscilloscope
3——Test harness insulation pad	9——50Ω attenuator 50Ω
4 - Peripherals	10——Capacitive coupling clamp CCC
5 - ground plane	11 - Test pulse generator
6 - power supply

Figure 20 Direct capacitive coupling test layout - DCC method

illustrate:

1——Test pulse generator 6——Power supply

2——DUT 7——analog load

3——connection harness C——high voltage (200 V) ceramic capacitor

4 - Ground plane

5——I/O line under test

Figure 21 Inductive coupling test layout - ICC method

1——The DUT under test 6——Power line and ground wire

2——Test pulse generator connection harness 7——Insulation pad (50mm±10mm)

3——Coupling clamp (150mm away from the sample to be tested) ICC 8——Ground plane

4——peripheral equipment 9—battery

5——Test harness (length not exceeding 2m) 10——DC power supply DC

11——50 Ω coaxial cable (up to 0.5m)

1. Transient Conduction Immunity (CIP)

Comply with the relevant requirements in ISO 7637-1:2015 and ISO 7637-2:2011.

Only when the test level exceeds the requirements in Table 27, the function of the tested sample is allowed to deviate from the design requirements.

Table 27 Power line transient conduction anti-interference requirements

Pulse number	Pulse parameter 1	Test pulse requirements 3	functional status
1	Us=-112V	5000 pulses	The functional state should meet the requirements of Class C, and the memory function should meet the requirements of Class A.
2a	Us=+55V	5000 pulses	Class A
2b	Us=+10V	10 pulses	The functional status should meet the requirements of Class C, and the memory function should meet the requirements of Class A
3a	Us=-165V	1h	Class A
3b	Us=+112V	1h	Class A
5a2	Us=+87V	10 pulses at 1 minute intervals	Class A
5b	Us=+35V, td(5a)=400 ms, Ri =2Ω	10 pulses at 1 minute intervals	Class C
Note 1: The unspecified test parameters are carried out according to the requirements of ISO 7637-2 & ISO 16750, where the pulse 5 test level Us is the peak voltage. Note 2: If centralized load dump protection is used, pulse 5a is not required, only pulse 5b is applied. Pulse 5 is not required for electronic and electrical systems and parts that are only used in new energy vehicles that contain DC/DC parts. Note 3: The pulse interval time of some waveforms can be executed with reference to the system power-down recovery time in the test plan.

1. Electrostatic Discharge (ESD)

This test item is suitable for high/low voltage parts/systems, and the high voltage system needs to be powered on during the test. Comply with the relevant requirements in ISO 10605:2008.

The test facility should be placed in an environment with a temperature of (23±3)°C and a relative humidity of 20% to 40% (20°C and 30% relative humidity are preferred).

Only when the test level exceeds the requirements in Table 28 and Table 29, the function of the tested sample is allowed to deviate from the design requirements.

Table 28 Handheld electrostatic discharge parameters (non-operating mode)

discharge type	test level	mannequin	Discharge times and recovery time at discharge point	discharge point	functional requirements
contact discharge- Pin	±4kV ±6kV	330Ω 150pF	3+&3-; 3s	Each Pin of the connector	Functional status should meet Class C requirements.
contact discharge	±6kV ±8kV	330Ω 150pF	10+&10-; 3s	Part exposed surfaces and crevices
air discharge	±8kV ±15kV	330Ω 150pF	10+&10-; 3s	Part exposed surfaces and crevices

Table 29 Working electrostatic discharge parameters (working mode)

discharge type		test level	mannequin	Discharge times and recovery time at discharge point	discharge point	functional requirements
discharge type		test level	mannequin	Discharge times and recovery time at discharge point	discharge point	Region I	Region II	Region III
direct discharge	contact discharge	±6kV	330Ω 330pF	10+&10-;3s	All operating handles, keys, switches and all accessible surfaces	A	A	A
		±8kV	330Ω 330pF	10+&10-;3s		C	A	A
		±8kV	330Ω 330pF	10+&10-;3s	Connect the I/O port of the switch, the CAN communication port, and the USB port b	C	C	A
	air discharge	±8kV	330Ω 330pF	10+&10-;3s	All operating handles, keys, switches and all accessible surfaces	A	A	A
		±15 kV	330Ω 330pF	10+&10-;3s		C	A	A
		±25a kV	330Ω 150pF	3+&3-;3s	Accessible part surfaces outside the vehicle, refer to the test plan for details	C	C	C
indirect discharge	contact discharge	±8kV	330Ω 330pF	10+&10-;3s	Discharge for three discharge islands	C	A	A
		±15 kV	330Ω 330pF	10+&10-;3s		C	C	A
		±20 kV	330Ω 330pF	10+&10-;3s		——	——	C
a: Requirements limited to devices that can be accessed directly from the outside of the vehicle without touching any part of the vehicle (eg door lock switches, headlight switches, instrumentation). b: Test at the terminal of the 1m wiring harness. For the communication bus test, a CAN isolator needs to be added between the DUT and the test auxiliary instrument.

Figure 22 Example of electrostatic discharge (non-operating mode)

illustrate:

1——The tested sample DUT 5——Horizontal coupling plate HCP

2——electrostatic discharge generator 6——earth point

3——Electrostatic discharge generator main equipment 7——2×470 kΩ grounding resistance 2×470kΩ

4—Non-conductive test table 8—Mat (if required)

Figure 23 Direct discharge (working mode)

illustrate:

1——Field coupling plate 9——Artificial network

2—Field coupling zone 10—Battery and supporting equipment ground reference point

3——discharge island 11——the near-end grounding DUT of the sample under test

4——DUT 12—Coupling board, ESD generator and safety ground reference point for sample under test and wiring harness isolation board

5——The tested sample DUT 13——2×470kΩ safety grounding high voltage resistance 2×470kΩ

6——Test sample harness DUT 14——Horizontal coupling plate HCP

7——battery 15——ESD generator ESD

8 - Peripheral support equipment

Figure 24 Indirect discharge (working mode)

illustrate:

1——Field coupling plate 9——Artificial network

2—Field coupling zone 10—Battery and supporting equipment ground reference point

3——Discharge area 11——The grounded DUT near the end of the sample under test

4——DUT 12—Coupling board, ESD generator and safety ground reference point for sample under test and wiring harness isolation board

5——The tested sample DUT 13——2×470kΩ safety grounding high voltage resistance 2×470kΩ

6——Test sample harness DUT 14——Horizontal coupling plate HCP

7——battery 15——ESD generator ESD

8 - Peripheral support equipment

1. Surge Immunity

This test is designed to verify the immunity of AC or DC charging systems. The test method shall meet the corresponding requirements of IEC 61000-4-5;2005.

For AC power lines: ±2kv open circuit test voltage between grounds, ±1kv between lines, rise time 1.2μS, dwell time 50μS. For each of the following angles: 0, 90, 180 and 270 degrees, each surge should be repeated 5 times with one minute intervals between each.

For DC power lines: ±0.5kv open circuit test voltage between ground wires, ±0.5kv voltage between lines, rise time 1.2μS, dwell time 50μS. Each surge should be repeated 5 times with one minute intervals between each.

1. Electrical Fast Burst Immunity

This test is designed to verify the immunity of AC or DC charging systems, test method. Specifically, it shall meet the requirements of IEC 61000-4-4;2004.

The test level requirements shall meet the requirements of Level 3 in Chapter 5 of IEC 61000-4-4;2004.

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