BYD Auto Electrical and Electronic Components EMC Test Methods and Requirements-Q/BYDQ-A1901.706.3-2012_Century Wisdom (Suzhou) Testing Technology Co., Ltd

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BYD Auto Electrical and Electronic Components EMC Test Methods and Requirements-Q/BYDQ-A1901.706.3-2012

Release time:

2023-01-05 00:00

Source:

This standard specifies the test methods and related requirements for the electromagnetic compatibility of automobiles and electrical and electronic components. This standard applies to on-board electrical and electronic components of fuel vehicles, pure electric vehicles, and hybrid vehicles developed by BYD Automobile Co., Ltd.

Test project introduction

1. Conducted disturbance test

Frequency range: 0.15MHz～108MHz, formulated with reference to CISPR 25-2008. Conducted disturbance test methods include voltage method and current probe method. The voltage method can be used to assess the characteristics of the disturbance signal propagating along the power line, and the current probe method can be used to assess the characteristics of the disturbance signal propagating along the signal line or control line

1.1 Voltage method

① Test layout: There are two layout methods: remote grounding (the power return line exceeds 200mm) and near-end grounding (the power return line does not exceed 200mm).

Note: 1) Power supply; 2) Artificial power network; 3) DUT; 4) Auxiliary equipment; 5) Ground plane; 6) Power line; 7) Insulation plate; 8) Double shielded cable; 9) Receiver; 10) Shielded room; 11) 50Ω load; 12) Wall connector.

Figure 1 Conducted disturbance - Schematic diagram of the far-end grounding arrangement of the DUT

Note: 1) Power supply; 2) Artificial power network; 3) DUT; 4) Auxiliary equipment; 5) Ground plane; 6) Power line; 10) shielded room; 11) wall connector.

Figure 2 Conducted disturbance - Schematic diagram of the near-end grounding arrangement of the DUT

② Test limit

See Table 1 and Table 2 for the test limits of conducted disturbance voltage method

Table 1 Limits of Conducted Disturbance by Voltage Method (Peak or Quasi-Peak Detector)

grade	Limit / dBμV
	0.15～0.3		0.53～1.8		5.9～6.2		26～28		30～41		41～54		54～68		68～88		88～108
	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP
I	110	97	86	73	77	64	68	55	68	55	58	55	58	-	58	49	62	49
II	100	87	78	65	71	58	62	49	62	49	52	49	52	-	52	43	56	43
III	90	77	70	57	65	52	56	43	56	43	46	43	46	-	46	37	50	37
IV	80	67	62	49	59	46	50	37	50	37	40	37	40	-	40	31	44	31
Ⅴ	70	57	54	41	53	40	44	31	44	31	34	31	34	-	34	25	38	25
Note: (1) Level Ⅰ in the table is mandatory test level, and other levels are recommended test levels; (2) The unit of frequency is MHz; (3) PK means peak value, and QP means quasi-peak value.

Table 2 Limits of Conducted Disturbance by Voltage Method (Average Detector)

grade	Limit / dBμV
	0.15～0.3	0.53～1.8	5.9～6.2	26～28	30～41	41～54	54～68	68～88	88～108
	AV	AV	AV	AV	AV	AV	AV	AV	AV
I	90	66	57	48	48	48	48	42	42
II	80	58	51	42	42	42	42	36	36
III	70	50	45	36	36	36	36	30	30
IV	60	42	39	30	30	30	30	twenty four	twenty four
Ⅴ	50	34	33	twenty four	twenty four	twenty four	twenty four	18	18
Note: (1) Level I in the table is mandatory test level, and other levels are recommended test levels. (2) The unit of frequency is MHz; (3) AV stands for average value.

1.2 Current probe method

Test layout

Current Probe Placement Table

frequency	distance
0.15MHz～108MHz	50mm from the tested part
0.15MHz～108MHz	750mm from the tested part

Note: 1) Power supply; 2) Artificial power network; 3) DUT; 4) Auxiliary equipment; 5) Ground plane; 6) Tested wiring harness; 7) Insulating board; 8) Double-layer shielded cable; ; 10) shielded room; 12) wall connector; 13) optical fiber; 14) current probe;

Figure 4 Schematic diagram of test layout for conducted disturbance-current probe method

②. Test limit

See Table 4 and Table 5 for the test limits of the conducted disturbance current probe method.

Table 4 Limits of Conducted Disturbance by Current Probe Method (Peak or Quasi-Peak Detector)

grade	Limit / dBμA
	0.15～0.3		0.53～1.8		5.9～6.2		26～28		30～41		41～54		54～68		68～88		88～108
	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP	PK	QP
I	90	77	58	45	43	30	34	twenty one	34	twenty one	twenty four	twenty one	twenty four	-	twenty four	15	28	15
II	80	67	50	37	37	twenty four	28	15	28	15	18	15	18	-	18	9	twenty two	9
III	70	57	42	29	31	18	twenty two	9	twenty two	9	12	9	12	-	12	3	16	3
IV	60	47	34	twenty one	25	12	16	3	10	3	6	3	6	-	6	-3	10	-3
Ⅴ	50	37	26	13	19	6	10	-3	4	-3	0	-3	0	-	0	-9	4	-9
Note: (1) Level Ⅰ in the table is mandatory test level, and other levels are recommended test levels; (2) The unit of frequency is MHz; (3) PK means peak value, and QP means quasi-peak value.

Table 5 Limits of Conducted Disturbance by Current Probe Method (Average Detector)

grade	Limit / dBμA
	0.15～0.3	0.53～1.8	5.9～6.2	26～28	30～41	41～54	54～68	68～88	88～108
	AV	AV	AV	AV	AV	AV	AV	AV	AV
I	70	38	twenty three	14	14	14	14	8	8
II	60	30	17	8	8	8	8	2	2
III	50	twenty two	11	2	2	2	2	-4	-4
IV	40	14	5	-6	-6	-6	-6	-10	-10
Ⅴ	30	6	-1	-10	-10	-10	-10	-16	-16
Note: (1) Level Ⅰ in the table is mandatory test level, and other levels are recommended test levels; (2) The unit of frequency is MHz; (3) AV stands for average value.

2 Radiation disturbance test

The purpose of this test is to evaluate the electromagnetic disturbance caused by the device under test and radiated through the wiring harness. This section specifies the radio disturbance limits and measurement methods in the frequency range from 150kHz to 2500MHz. This part is formulated with reference to CISPR 25-2008.

① Antenna reference point

Antenna Reference Point Selection Table

antenna	reference point	antenna	reference point
monopole antenna	monopole vertical section	biconical antenna	Antenna Center Point/Phase Center
log periodic antenna	antenna tip	horn antenna	Antenna Front Plane

From 150 kHz to 30 MHz, only the vertical polarization direction test is performed, and from 30 MHz to 2.5 GHz, the vertical and horizontal polarization direction tests are performed;

For frequency ≤1000MHz, the field receiving antenna should be positioned in front of the center of the tested wire harness; for frequencies above 1000MHz, the center of the antenna should be positioned directly on the DUT instead of the center of the tested wire harness

② Test layout: The following figure is an introduction to the layout of the monopole antenna. The layout of other antennas is the same as the figure below, except that the ground plane is not required

Note: 1) DUT (near-end grounding if necessary); 2) DUT harness; 3) Auxiliary equipment; 4) Power supply; 5) Artificial power network; 6) Ground plane; 7) Insulation board; 8) 1m Monopole rod antenna (including 600cm×600cm ground plane, h=900±50mm, hcp=h±10mm); 9) Ground bonding plate; 10) Double-layer shielded cable; 11) Wall connector; 12) Receiver; 13) Semi-anechoic chamber; 14) Antenna matching unit; 15) Surveillance system.

Figure 5 Radiation disturbance test of components - layout diagram of monopole antenna

③ Test limits See Table 7 and Table 8 for test limits of radiation disturbance of components.

Table 7 Radiated disturbance limits (peak and quasi-peak)

frequency band (MHz)	Limit dBμV/m
	Level I		Level II		Level III		Level IV		Level Ⅴ
	the peak	quasi-peak	the peak	quasi-peak	the peak	quasi-peak	the peak	quasi-peak	the peak	quasi-peak
0.15～0.3	86	73	76	63	66	53	56	43	46	33
0.53～1.8	72	59	64	51	56	43	48	35	40	27
5.9～6.2	64	51	58	45	52	39	46	33	40	27
26～28	64	51	58	45	52	39	46	33	40	27
30～41	64	51	58	45	52	39	46	33	40	27
41～54	52	51	46	45	40	39	34	33	28	27
54～68	52	-	46	-	40	-	34	-	28	-
68～87	52	46	46	40	40	34	34	28	28	twenty two

Table 7 (continued) Radiated disturbance limits (peak and quasi-peak)

frequency band (MHz)	Limit dBμV/m
	Level I		Level II		Level III		Level IV		Level Ⅴ
	the peak	quasi-peak	the peak	quasi-peak	the peak	quasi-peak	the peak	quasi-peak	the peak	quasi-peak
87～88	52	49	46	43	40	37	34	31	28	25
88～108	62	49	56	43	50	37	44	31	38	25
142～171	59	46	53	40	47	34	41	38	35	twenty two
171～245	50	-	44	-	38	-	32	-	26	-
300～330	56	-	50	-	44	-	38	-	32	-
380～420	62	49	56	43	50	37	44	31	38	25
420～450	56	49	50	43	44	37	38	31	32	25
450～512	62	49	56	43	50	37	44	31	38	25
512～820	65	-	59	-	53	-	47	-	41	-
820～944	65	55	59	49	53	43	47	37	41	31
944～960	68	55	62	49	56	43	50	37	31	twenty four
1447～1494	52	-	46	-	40	-	34	-	28	-
1567～1583	-	-	-	-	-	-	-	-	-	-
1803～1992	68	-	62	-	56	-	50	-	44	-
2010～2025	68	-	62	-	56	-	50	-	44	-
2108～2172	68	-	62	-	56	-	50	-	44	-
2320～2345	58	-	52	-	46	-	40	-	34	-
2400～2500	68	-	62	-	56	-	50	-	44	-
Note: The frequency bands used by broadcasting and mobile communications in my country are different from those in Europe, America and Japan, so in terms of test frequency band expansion, the required control frequency bands and limits should be specified according to the actual situation in China and the actual use of vehicles.

Table 8 Radiation disturbance limits (average value)

frequency band (MHz)		Limit dBμV/m
		Level I	Level II		Level III		Level IV		Level Ⅴ
0.15～0.3		66	56		46		36		26
0.53～1.8		52	44		36		28		20
5.9～6.2		44	38		32		26		20
26～28		44	38		32		26		20
30～41		44	38		32		26		20
41～54		42	36		30		twenty four		18
54～68		42	36		30		twenty four		18
68～87		39	33		27		twenty one		15
87～88		42	36		30		twenty four		18
88～108		42	36		30		twenty four		18
142～171		39	33		27		twenty one		15
171～245		40	34		28		twenty two		16
300～330		42	36		30		twenty four		18
380～420		42	36		30		twenty four		18
frequency band (MHz)	Limit dBμV/m
	Level I			Level II		Level III		Level IV		Level Ⅴ
420～450	42			36		30		twenty four		18
450～512	42			36		30		twenty four		18
512～820	55			49		43		37		31
820～944	48			42		36		30		twenty four
944～960	48			42		36		30		twenty four
1447～1494	42			36		30		twenty four		18
1567～1583	34			28		twenty two		16		10
1803～1992	48			42		36		30		twenty four
2010～2025	48			42		36		30		twenty four
2108～2172	48			42		36		30		twenty four
2320～2345	48			42		36		30		twenty four
2400～2500	48			42		36		30		twenty four
Note: 1) The frequency bands used by broadcasting and mobile communications in my country are different from those in Europe, America and Japan, so in terms of test frequency band expansion, the required control frequency bands and limits should be specified according to the actual situation in China and the actual use of vehicles.

3 RF current injection anti-interference test

The test frequency range is 1~400MHz. This part uses the current injection method to simulate the electromagnetic radiation environment, and is applicable to all vehicle-mounted electronic devices containing wiring harnesses that may be affected by electromagnetic radiation in the actual vehicle state, especially electronic devices related to driving safety. This part is formulated with reference to ISO 11452-1-2005 and ISO 11452-4-2005.

The purpose of this part of the test is to assess the anti-interference ability of the electronic device to the electromagnetic radiation energy coupled from the wiring harness.

① Test requirements

a) The test frequency range covers 1~400MHz.

b) During the test, the test frequency step value shall not be greater than the values listed in Table 9.

Table 9 BCI test frequency step

Frequency range (MHz)	Step frequency (MHz)
1～30	0.5
30～200	2
200～400	5

② Test layout

Note: 1) signal source; 2) power amplifier; 3) monitoring system; 4) power supply; 5) artificial power network; 6) auxiliary equipment; 7) insulation board;

8) Current injection probe; 9) Tested wiring harness; 10) Tested piece; 11) Shielded room.

Fig.1 Schematic layout of radio frequency current injection anti-jamming test

Current probe placement:

Within the frequency range of 1MHz to 30MHz, the current injection probe should be placed in the following two positions and tested separately:

——150mm±10mm from the tested part;

—— 450mm±10mm from the tested piece.

Within the frequency range of 30MHz to 400MHz, the current injection probe should be placed in the following two positions and tested separately:

——450mm±10mm from the tested part;

—— 750mm±10mm from the tested piece.

③ Test level and judgment standard a) See Table 10 and Figure 11 for test level requirements. b) See Table 11 for the test criteria.

Table 10 Test Level Requirements

frequency band	Frequency range (MHz)	Level Ⅰ (dBμA)	Level (dBμA)	modulation type
1	1～15	64+30.61*lg(Freq(MHz))	70+30.61*lg(Freq(MHz))	CW, AM 80%
2	15～30	100	106	CW, AM 80%
3	30～400	100-8.89*lg(Freq(MHz)/30)	106-8.89*lg(Freq(MHz)/30)	CW, AM 80%

Figure 11 Level requirements diagram of radio frequency current injection anti-interference test

Table 11 Judgment criteria for radio frequency current injection anti-interference test

test level	Non-safety function A	Non-safety function B	Safety function A.	Safety function B
I	B	B	A	A
II	C	B	A	A

4 Radio frequency radiation anti-interference test

This part applies to all vehicle electronic devices that may be disturbed by radiated electromagnetic fields under actual vehicle use, especially electronic devices related to driving safety. Purpose of the test: To assess the anti-interference ability of vehicle electronic devices against radiated electromagnetic fields. This part is formulated with reference to ISO 11452-1-2005 and ISO 11452-2-2004.

①Test requirements

a) The test frequency range covers 400-2000MHz and 2700-3100MHz.

b) During the test, the test frequency step value shall not be greater than the values listed in Table 12.

Table 12 Frequency Step of Radio Frequency Radiation Anti-interference Test

Frequency range (MHz)	Step frequency (MHz)
400～1000	10
1000～2000	20
2700～3100	40

② Test layout and test method

This test method is to expose the device under test to the radiated electromagnetic field generated by the antenna for the test. The test can be carried out according to any of the following methods: 1) ALSE method (ISO 11452-2), 2) reverberation chamber method (IEC 61000-4-21). The reverberation chamber method is to reflect the radio frequency electromagnetic wave emitted by the antenna through a large stirrer and an internal reflector multiple times, and generate a strong dynamic field strength in the effective test area of the shielding body to interfere with the dynamic field strength of the test piece. , suitable for 1200MHz ~ 1400MHz, 2700MHz ~ 3100MHz frequency band radar wave testing.

Note: 1) DUT; 2) Wiring harness under test; 3) Auxiliary equipment; 4) Battery; ; 10) Double-layer shielded cable; 11) Interface board; 12) RF signal generator; 13) Semi-anechoic chamber.

Figure 12 Schematic diagram of ALSE anti-jamming test layout (frequency ≤ 1000 MHz)

③ Test grade and judgment standard

a) See Table 13 for test level requirements; b) See Table 14 for test criteria.

Table 13 Test level requirements for radio frequency radiation anti-interference 400MHz～3100MHz

frequency band

Frequency range (MHz)

Class I (V/m)

Class II (V/m)

modulation type

400～800

100

CW, AM 80%

Pulse PRR=18Hz, PD=28ms

800～2000

CW, Pulse PRR=217Hz, PD=0.57ms

1200～1400

300

(1)

600

(2)

Pulse PRR=300Hz, PD=3μs

(1)

Limited to output 50 pulses per second

2700～3100

300

(1)

600

Note: 1) 600V/m is only applicable to specific components, which can be agreed upon by the customer and the supplier, and the products subject to this level of test should be clearly stated in the technical conditions;

2) When using the reverberation reflection method for testing, the PD should be extended to 6μs.

Table 14 Judgment criteria for radio frequency radiation anti-interference test

test level	Non-safety function A	Non-safety function B	Safety function A.	Safety function B
I	B	B	A	A
II	C	B	A	A

5 Transient conduction disturbance test

The purpose of this test is to evaluate the electrical transient pulses of on-board electrical/electronic components. This test item is only applicable to equipment or devices that turn on or off inductive loads (such as engines, etc.). Reference standards This part is formulated with reference to ISO 7637-2-2011.

① Test layout

During the test, the layout of the test equipment and the DUT and the length of the wiring harness shall be carried out according to Figure 14.

② Test level and transient conduction disturbance test limit

Table 16 Transient Conducted Disturbance Test Limits

Power Systems	Pulse polarity	Pulse limit (V)
Power Systems	Pulse polarity	I	II	III	IV
12V	Positive slow pulse	*	+75	+37	+25
	negative slow pulse	*	-100	-75	-50
	positive fast pulse	*	+100	+75	+50
	negative fast pulse	*	-150	-112	-75
24V	Positive slow pulse	*	+75	+37	+25
	negative slow pulse	*	-200	-150	-100
	positive fast pulse	*	+200	+150	+100
	negative fast pulse	*	-200	-150	-100
Note: (1) *Determined by the automaker and parts supplier through negotiation; (2) Class II is mandatory.

6 Transient conduction anti-interference test

This part applies to road vehicles with nominal voltages of 12V and 24V electrical systems. All electronic components involving categories P, A, MS, Y, BCM, and ECM need to be tested. Purpose of the test: To assess the anti-interference ability of the DUT to the interference signal from the power line. It is formulated with reference to ISO 7637-2-2011 and ISO 16750-2-2010. All products that comply with the provisions of this part comply with the requirements of ISO 7637-2-2011 and ISO 16750-2-2010.

① The test pulse parameters are as follows:

a) Test pulse 1. See Figure 15 and Table 17 for the pulse waveform and parameters.

b) Test pulses 2a, 2b. See Figure 16 and Table 18 for the pulse waveform and parameters of 2a, and Figure 17 and Table 19 for the pulse waveform and parameters of 2b.

Table 18 Parameters of test pulse 2a

parameter	12V system	24V system
UA	13.5V±0.5V	27V±1V
US	37V～112V
Ri	2Ω
td	0.05ms
tr	0 (1 - 0.5) μs
t1	0.2s～5s
Depending on the switch, the repetition time t1 can be shorter. Test times can be shortened by using short repetition times

c) Test pulses 3a, 3b. See Figure 18 and Table 20 for the pulse waveform and parameters of 3a, and Figure 19 and Table 21 for the pulse waveform and parameters of 3b.

d) Test pulse 4 (start voltage disturbance test). See Figure 20 and Table 22a and Table 22b for pulse waveform parameters and grades.

Note: 1) U voltage, V; 2) t time, s; 3) af=2Hz.

Figure 20 Test pulse 4

Table 22a Test pulse 4 parameters - 12V system

test level parameter			Ⅰ (Typical room temperature startup)	Ⅱ (Cold start in severe cold area)	Ⅲ (abnormal start with gear)	Ⅳ (generally cold start in the northern region)	tolerance
US (V)			8	4.5	3	6	-0.2V
UA (V)			9.5	6.5	5	6.5	-0.2V
UN (V)			12				±0.2V
tr (ms)			10				±10%
t 6 (ms)			15
t 7 (ms)			50
t 8 (s)			1	10	1	10
tf (ms)			40	100	100	100
Product Category	Terminal voltage (V)		performance level				/
Product Category	USmin	US max	performance level
A	6	16	A	B	B	A
B	8	16	A	B	C	B
C	9	16	B	C	C	C
D.	10.5	18	B	C	C	C
Notes: 1) Product category A: For products that should have functionality during engine start; Product category B: For products that do not need to have functionality during engine start; Product category C: For products that need to have functionality when engine is off; Products Category D: For products that should have functions during engine operation; 2) Before starting the disturbance test, the correct working voltage range must be determined according to the working needs of the product. Since the start-up disturbance test simulates different working conditions, it is recommended to conduct all start-up disturbance tests of different levels for all products that may work during start-up, and make judgments based on the performance level requirements of the operating voltage range at different start-up disturbance levels.

e) Test pulses 5a, 5b (load dump test). 5a Pulse waveform and parameters see Figure 21 a) and Table 23, 5b pulse waveform and parameters

See Figure 21 b) and Table 23 for the numbers.

② Test layout

a) Pulse adjustment b) Pulse injection c) Diode bridge Note: 1) Oscilloscope or equivalent equipment; 2) Voltage probe; 3) Test pulse generator with power supply internal resistance Ri; 4) DUT; 5) Ground plane ;6)

Ground wire; 7) Resistor Rv (0.7Ω≤Rv≤40Ω); 8) Diode bridge (multiple single diodes may need to be added to meet specific suppression voltage levels).

③Test grade and judgment standard

a) See Table 24 for test severity levels; b) See Table 25 for performance judgment standards.

Figure 22 Transient anti-interference test layout

test pulse	test level						Minimum number of pulses or test time	pulse repetition time
	12V			24V				pulse repetition time
	I	II	III	I	II	III		the smallest	maximum
1	-75	-112	-150	-300	-450	-600	5000	0.5s	1)
2a	37	55	112	37	55	112	5000	0.2s	5s
2b	10	10	10	20	20	20	10	0.5s	5s
3a	-112	-165	-220	-150	-200	-300	1 hour	90ms	100ms
3b	75	112	150	150	200	300	1 hour	90ms	100ms
5a	65	87	*	123	174	*	5	2)	2)
5b	65	87	*	123	174	*	5	2)	2)
Note: 1) The selection of the maximum pulse repetition time and the minimum pulse repetition time must ensure that it can be correctly initialized before the arrival of the next pulse, and the maximum pulse repetition time is ≥ 0.5s; 2) Since the minimum number of test pulses is 1, the pulse cycle time is not given. When multiple pulses are applied, a minimum delay time of 1min should be allowed between pulses; 3) *Determined through negotiation between automakers and parts suppliers.

Table 25 Transient Conduction Anti-interference Test Performance Judgment Criteria

test pulse		Non-safety function A	Non-safety function B	Safety function A.	Safety function B
1	I	C	C	C	C
	II	C	C	C	C
	III	C	C	C	C
2a	I	C	B	A	A
	II	C	C	A	A
	III	C	C	A	A
2b	I	C	C	C	C
	II	C	C	C	C
	III	C	C	C	C
3a	I	C	B	A	A
	II	C	C	A	A
	III	C	C	A	A
3b	I	C	B	A	A
	II	C	C	A	A
	III	C	C	A	A
5a	I	C	C	A	A
	II	C	C	B	A
	III	*	*	*	*
5b	I	C	C	A	A
	II	C	C	B	A
	III	*	*	*	*
*To be negotiated by automakers and parts suppliers.

7. Transient coupling anti-interference test

This part is applicable to road vehicles with nominal voltages of 12V, 24V and 42V electrical systems. All electronic components involving categories A, S, MS, Y and ECM must be tested. If the DUT depends on its own function or structure and is not affected by a certain type of electrical transient pulse in the vehicle (such as the pulse defined in this part), then such pulse test may not be carried out. Purpose of the test: To assess the anti-interference ability of the DUT to fast and slow transient disturbance pulses coupled to non-power lines. This part is formulated with reference to ISO 7637-3-2007, and all products that comply with the provisions of this part are in compliance with the requirements of ISO 7637-3-2007.

①Test requirements

a) The test equipment should meet the requirements of ISO 7637-3-2007.

b) This section provides three coupling test methods. The applicability of each method is shown in Table 26. For slow and fast transient tests, only one applicable method needs to be selected:

- capacitive coupling clamp (CCC);

- direct capacitor coupling method (DCC);

- Inductively coupled clamp (ICC).

Table 26 Applicability of test methods

Transient type	CCC method	DCC method	ICC method
slow pulse	not applicable	Be applicable	Be applicable
fast pulse	Be applicable	Be applicable	not applicable

② Test pulse parameters:

——See Figure 23 and Figure 24 for fast transient pulse waveforms, and see Table 27 for relevant parameters;

——See Figure 25 and Figure 26 for slow transient pulse waveforms, and see Table 28 for relevant parameters.

Figure 23 Fast transient pulse a

Figure 24 Fast transient pulse b

Table 27 Fast transient pulse parameters

parameter		12V system	24V system	42V system
Us (V)	fast pulse a	-10V～-60V	-14V～-80V	-10V～-60V (-20V～-120V)
	fast pulse b	+10V～+40V	+14V～+80V	+10V～+40V (+20V～+80V)
tr		5ns
td		0.1μs
t1		100μs
t4		10ms
t5		90ms
Ri		50Ω

Figure 25 Slow Transient Pulse - Positive Pulse

Figure 26 Slow Transient Pulse - Negative Pulse

Table 28 Slow transient pulse parameters

parameter			12V system	24V system	42V system
Us (V)	Slow Pulse+	DCC	+8V～+30V	+15V～+45V	+8V～+30V
		ICC	+3V～+6V	+4V～+10V	+3V～+6V
	slow pulse-	DCC	-8V～-30V	-15V～-45V	-8V～-30V
		ICC	-3V～-6V	-4V～-10V	-3V～-6V
tr			≤1μs
td			0.05ms
t1			0.5s～5s
Ri			2Ω

③Test layout

Note: 1) Insulation support plate (if the DUT is not connected to the vehicle ground); 2) DUT; 3) Insulation support plate of the test harness; 4) Auxiliary device

(such as sensors, loads, accessories), the same as the installation on the vehicle; 5) ground plane; 6) power supply; 7) battery; 8) oscilloscope; 9) 50Ω attenuator; 10) CCC; 11) test pulse generator. The selected dimensions shall be specified in the test plan and recorded in the test report.

Figure 27 Schematic diagram of test arrangement for capacitive coupling clamp (CCC) method

Note: 1) Test pulse generator; 2) DUT; 3) Wire harness; 4) Ground plane; 5) I/O line under test; 6) Power supply; 7) Auxiliary device; 8) High voltage (minimum 200V) Ceramic capacitors. All wiring harnesses should be placed 50±5mm above the ground plane.

Figure 28 Schematic diagram of test arrangement for direct capacitive coupling (DCC) method

Note: 1) DUT; 2) Test pulse generator; 3) ICC (ICC placed 150mm away from DUT); 4) Auxiliary device; 5) Test harness (length ≤ 2m); 6) Grounding wire; 7) Insulation plate (50 mm±10mm); 8) Ground plane; 9) Battery; 10) DC power supply; 11) 50Ω coaxial cable (≤

0.5 m) Figure 29 Schematic diagram of the test layout for the inductively coupled clamp (ICC) method

④ Test grade and judgment standard

a) See Table 29 for test severity levels; b) See Table 30 for performance judgment standards.

Table 29 Test severity level

test pulse	Electrical System	Test voltage (V)				Test time (min)	Pulse cycle time (ms)
test pulse	Electrical System	I	II	III	IV	minimum value	Pulse cycle time (ms)
fast pulse a (DCC and CCC)	12V	-10	-20	-40	-60	10	100
	24V	-14	-28	-56	-80
	42V	-10(-20)	-20(-40)	-40(-80)	-60(-120)
fast pulse b (DCC and CCC)	12V	+10	+20	+30	+40	10	100
	24V	+14	+28	+56	+80
	42V	+10(+20)	+20(+40)	+30(+60)	+40(+80)
DCC slow pulse +	12V	+8	+15	+23	+30	5	*
	24V	+15	+25	+35	+45
	42V	+8	+15	+23	+30
DCC slow pulse -	12V	-8	-15	-twenty three	-30	5	*
	24V	-15	-25	-35	-45
	42V	-8	-15	-twenty three	-30
ICC slow pulse +	12V	+3	+4	+5	+6	5	*
	24V	+4	+6	+8	+10
	42V	+3	+4	+5	+6
ICC slow pulse -	12V	-3	-4	-5	-6	5	*
	24V	-4	-6	-8	-10
	42V	-3	-4	-5	-6
Note: 1) *Determined by the automaker and parts supplier through negotiation. 2) The amplitude in the table is the Us value determined for each test pulse; for the CCC method, it is the reference voltage at the output terminal of the CCC, or for the DCC method, it is the open-circuit reference voltage at the output terminal of the generator.

Table 30 Performance Judgment Criteria

test pulse		Non-safety function A	Non-safety function B	Safety function A.	Safety function B
fast pulse a (DCC and CCC)	I	C	B	A	A
	II	C	B	A	A
	III	C	B	A	A
	IV	C	B	A	A
fast pulse b (DCC and CCC)	I	C	B	A	A
	II	C	B	A	A
	III	C	B	A	A
	IV	C	B	A	A
DCC slow pulse+	I	C	B	A	A
	II	C	B	A	A
	III	C	B	A	A
	IV	C	B	A	A

test pulse		Non-safety function A	Non-safety function B	Safety function A.	Safety function B
DCC slow pulse-	I	C	B	A	A
	II	C	B	A	A
	III	C	B	A	A
	IV	C	B	A	A
ICC slow pulse+	I	C	B	A	A
	II	C	B	A	A
	III	C	B	A	A
	IV	C	B	A	A
ICC slow pulse-	I	C	B	A	A
	II	C	B	A	A
	III	C	B	A	A
	IV	C	B	A	A

8 Electrostatic discharge anti-interference test

This standard applies to all road vehicle electronic devices that may cause electrostatic discharge under the following conditions:

- production assembly process;

- Handling, maintenance and service process;

——Customer use process. Purpose of the test: To assess the anti-interference ability of vehicle electronic devices against electrostatic discharge.

Formulated with reference to ISO 10605-2008, all products that are implemented in accordance with the provisions of this part meet the requirements of ISO 10605-2008

①Test requirements

Environmental requirements: temperature (23±5)℃, humidity (30%～50%)RH (recommended 20℃, 30%RH). The electromagnetic field generated by ESD may have adverse effects on the surrounding sensitive electronic equipment. If the laboratory needs to consider these factors, it is recommended that the test place be conducted in a shielded room.

Table 31 Relevant parameters of various discharge tests

test type			Energy storage capacitor	Discharge resistance	Discharge times	discharge interval	Discharge polarity
power test	direct discharge	air discharge	Device inside the vehicle 330pF Device outside the vehicle 150pF Undefined location: 330pF	330Ω	≥3 times	≥1s	Positive and Negative
		contact discharge
	indirect discharge	contact discharge			50 times	≥50ms
power failure test	direct discharge	air discharge	150pF		≥3 times	≥1s
		contact discharge

Table 32 Contact discharge mode current waveform parameters

Typical energy storage capacitor /discharge resistance	Peak current A	error%	T1 current A	error%	T2 current A	error%
150pF/330Ω	3.75	±10	2, (T1=30ns)	±30	1, (T2=60ns)	±30
330pF/330Ω	3.75	±10	2, (T1=65ns)	±30	1, (T2=130ns)	±30
150pF/2kΩ	3.75	0--+30	0.275, (T1=180ns)	±30	0.15, (T2=360ns)	±50
330pF/2kΩ	3.75	0--+30	0.275, (T1=400ns)	±30	0.15, (T2=800ns)	±50

Note: X, time, ns; Y, current, A; 1) 330pF/330Ω, 2) 150pF/330Ω.

Figure 30 150pF/330pF, 330Ω, 5kV current waveform

Note: X, time, ns; Y, current, A; 1) 330pF/2kΩ, 2) 150pF/2kΩ.

Figure 31 150pF/330pF, 2kΩ, 5kV current waveform

② Test layout

In the power-on state, the device is directly discharged during the test

③ Test grade and judgment standard

a) See Table 33 for test severity levels.

b) See Table 34 for performance judgment criteria.

c) The test severity level applicable to a specific product should be clearly defined in its product technical conditions.

Table 33 Test severity level

discharge type			Severity rating, kV
discharge type			I	II	III	IV	Ⅴ
power test	direct discharge	contact discharge	±4	±6	±8	-	-
	direct discharge	air discharge	±4	±6	±8	±15	±25
	indirect discharge	contact discharge	±4	±6	±8	±15	±25
power failure test	direct discharge	contact discharge	±4	±6	-	-	-
power failure test	direct discharge	air discharge	±4	-	±8	-	-
Note: 1) Regarding the connector test in power-off mode: the highest level I test is carried out, and the specific applicable level and judgment standards can also be negotiated by the customer and the supplier; 2) Level IV is only applicable to the on-board parts of electronic products; 3) Level Ⅴ is only applicable to parts of on-board electronic products that are directly accessible outside the vehicle.

Table 34 Performance Judgment Criteria

test level		Non-safety function A	Non-safety function B	Safety function A.	Safety function B
power on state	I	C	B	A	A
	II	C	C	A	A
	III	C	C	B	A
	IV	D.	C	B	A
	Ⅴ	D.	D.	B	A
power off state	I	D.
	II
	III

9 Low frequency magnetic field disturbance test

This section applies to the radiated emissions of the DUT and its interconnected wiring harness. In the frequency range of 20Hz to 200kHz, the limits and test methods for the magnetic field emission of the DUT and its interconnected harness are specified. This part is formulated with reference to MIL-STD-461F.

① Test layout and test method

a) The test layout is shown in Figure 34. Place the loop antenna at a distance of 70mm from the surface of the device under test or the wire harness, and make the plane of the loop antenna parallel to the surface of the device under test or parallel to the axis of the wire harness;

b) The measuring receiver or spectrum analyzer scans the entire frequency band to find out the frequency point of maximum radiation; c) Adjust the measuring receiver or spectrum analyzer to the frequency point or frequency range determined in 12.3.2 b); d) While slowly moving the loop antenna (at a distance of 70 mm) along one surface of the DUT or along the wire harness, monitor the output of the measuring receiver or spectrum analyzer, and record the maximum reading for each frequency determined in 12.3.2 c). the point;

e) At a distance of 70mm from the maximum radiation point, adjust the direction of the loop antenna plane so that the measuring receiver or spectrum analyzer can obtain a maximum reading and record this reading;

f) In the entire frequency range, select at least three maximum radiation frequency points and repeat 12.3.2 c) ~ 12.3.2 e); g) Perform 12.3.2 on each surface and each wire bundle of the tested object a) ~ 12.3.2 f)

Note: 1) Receiver; 2) Double shielded cable; 3) DUT; 4) Battery; 5) Artificial power network; 6) Auxiliary device; 7) Power supply; 8) Ground plane; 9) Loop antenna; 10 ) Wire harness under test; 11) Grounding strap;

Figure 34 Layout of low frequency magnetic field disturbance test

② Test limit

See Table 35 and Figure 35 for the test limits of low-frequency magnetic field disturbance.

Table 35 Low-frequency magnetic field disturbance test limits

Frequency (kHz)	Magnetic field disturbance limit/dBpT
0.02～1	162
1～100	162-40lgFreq(kHz)
100～200	62

Figure 35 Low-frequency magnetic field disturbance test limits

10 Low-frequency magnetic field anti-interference test

This section applies to the assessment of the sensitivity of magnetic sensitive devices to low frequency magnetic fields. In the frequency range of 15Hz ~ 150kHz, the test method for magnetic field immunity of the DUT is specified. This part is formulated with reference to ISO 11452-8-2007.

①Test requirements

a) The maximum length of the wiring harness is 2000mm, if necessary, the wiring harness on the real vehicle can be used;

b) The DUT must be placed on the insulating plate at a distance of 50mm from the radiation ring, or in the middle of the Helmholtz coil

② Test layout and test method

②Test method

a) Make the DUT work normally, the shortest time is 10 minutes; b) When monitoring the DUT, gradually increase the current delivered to the radiation ring or Helmholtz coil until the current at calibration is reached;

c) Keep the current during calibration for a certain period of time, observe whether the working state of the DUT changes, and record the phenomenon; d) Gradually reduce the current delivered to the radiation ring or Helmholtz coil;

e) Repeat the test in three axial directions; f) If a radiation ring is used for the test, all surfaces of the DUT should be tested. If one side of the device under test or a cable is tested for the entire frequency band

test, you only need to record the data of one surface or one cable;

g) During the radiation ring method test, the distance between the auxiliary equipment and the ground plane and the radiation ring is greater than 200mm. Divide each side of the DUT into a 100×100mm square area, and locate the radiation ring to the center of these areas. If the surface of the DUT is smaller than 100×100mm, position the radiation ring at the center of the DUT. The radiation ring is parallel to the surface of the test piece and the axis of the port, and the distance from the surface of the test piece is 50mm.

h) When testing by the Helmholtz method, if the measured piece is smaller than the coil radius, the coils should be at least 50mm away from the surface of the tested piece. On the contrary, if the tested part is larger than the radius of the coil, the coils should be at least 50mm away from the surface of the tested part and the distance between the coils should not exceed 1.5 times the radius. The coil is parallel to the surface of the test piece.

i) The dwell time of the test shall not be less than 2s. If the functional response time of the tested part is longer, sufficient dwell time shall be set (indicated in the EMC test plan). If there is a deviation in one or more functions of the DUT, the magnetic field strength should be reduced until the function of the DUT returns to normal, and then the magnetic field strength should be gradually increased until the deviation phenomenon reappears. This magnetic field strength should be recorded as the deviation threshold in the report. If the DUT is attached with a magnetically sensitive device, interference should be applied to the magnetically sensitive device to verify whether the DUT can work normally.

Note: 1) DUT; 2) Radiation ring; 3) Current probe; 4) Signal source and amplifier; 5) Oscilloscope; 6) Power supply; 7) Battery; 8) Sensor; 9) Actuator; 10) Insulation bracket ; 11) Ground plane (if required); 12) Triaxial position;

Figure 36 Radiation ring method test layout

③ Test grade and judgment standard

Table 36 Frequency step requirements for low-frequency magnetic field anti-interference test

frequency band (kHz)	Log frequency step (%)
0.015～150	10

Table 37 Low-frequency magnetic field anti-interference test level requirements (inner)

frequency band (kHz)	Class I (A/m)	Class II (A/m)	Grade Ⅲ(A/m)	Grade Ⅳ (A/m)	Grade Ⅴ (A/m)
0.015～1	30	100	300	1000	*
1～10	30/(Freq(kHz))2	100/(Freq(kHz))2	300/(f(kHz))2	1000/(f(kHz))2	*
10～150	0.3	1	3	10	*
*: Negotiated by automakers and parts suppliers.

Table 38 Low-frequency magnetic field anti-interference test level requirements (external)

frequency band (kHz)	Class I (A/m)	Class II (A/m)	Grade Ⅲ(A/m)	Grade Ⅳ (A/m)	Grade Ⅴ (A/m)
0.015～0.06	30	100	300	1000	*
0.06～0.18	30/(Freq(kHz)100 0/60)	100/(Freq(kHz)10 00/60)	300/(Freq(kHz)10 00/60)	1000/(Freq(kHz)1 000/60)	*
0.18～0.6	10	100/(Freq(kHz)10 00/60)			*
0.6～1.8		10			*
1.8～6			10		*
6～150			10	10	*
*: Negotiated by automakers and parts suppliers.

Table 39 Judgment criteria for low-frequency magnetic field anti-interference test

test level	Non-safety function A	Non-safety function B	Safety function A.	Safety function B
I	A	A	A	A
II	C	B	A	A
III	C	C	B	A
IV	D.	C	B	A
Ⅴ	*	*	*	*
*: Negotiated by automakers and parts suppliers.

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